从太阳-光致发光量子产率测量得出的过氧化物薄膜表面饱和电流密度

IF 8 2区材料科学 Q1 ENERGY & FUELS

Progress in Photovoltaics Pub Date : 2024-01-15 DOI:10.1002/pip.3767

Robert Lee Chin, Arman Mahboubi Soufiani, Paul Fassl, Jianghui Zheng, Eunyoung Choi, Anita Ho-Baillie, Ulrich W. Paetzold, Thorsten Trupke, Ziv Hameiri

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引用次数: 0

摘要

我们介绍了一种简单而强大的太阳光量子产率测量分析方法，可用于确定薄膜半导体的表面饱和电流密度。我们将该方法应用于不同吸收体厚度的最先进的多晶过氧化物薄膜。我们的研究表明，这些样品中的非辐射双分子重组源自表面。据我们所知，这是第一项展示和量化包晶体薄膜中非线性（双分子）表面重组的研究。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Surface saturation current densities of perovskite thin films from Suns-photoluminescence quantum yield measurements

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Surface saturation current densities of perovskite thin films from Suns-photoluminescence quantum yield measurements

We present a simple yet powerful analysis of Suns-photoluminescence quantum yield measurements that can be used to determine the surface saturation current densities of thin film semiconductors. We apply the method to state-of-the-art polycrystalline perovskite thin films of varying absorber thickness. We show that the non-radiative bimolecular recombination in these samples originates from the surfaces. To the best of our knowledge, this is the first study to demonstrate and quantify non-linear (bimolecular) surface recombination in perovskite thin films.

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来源期刊

Progress in Photovoltaics 工程技术-能源与燃料

CiteScore

18.10

自引率

7.50%

发文量

130

审稿时长

5.4 months

期刊介绍： Progress in Photovoltaics offers a prestigious forum for reporting advances in this rapidly developing technology, aiming to reach all interested professionals, researchers and energy policy-makers. The key criterion is that all papers submitted should report substantial “progress” in photovoltaics. Papers are encouraged that report substantial “progress” such as gains in independently certified solar cell efficiency, eligible for a new entry in the journal''s widely referenced Solar Cell Efficiency Tables. Examples of papers that will not be considered for publication are those that report development in materials without relation to data on cell performance, routine analysis, characterisation or modelling of cells or processing sequences, routine reports of system performance, improvements in electronic hardware design, or country programs, although invited papers may occasionally be solicited in these areas to capture accumulated “progress”.