基于开关冲击电压下频繁的电弧重燃现象识别油压板绝缘缺陷

IF 4.4 2区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
High Voltage Pub Date : 2024-01-12 DOI:10.1049/hve2.12393
Simeng Li, Yukun Zhang, Yunfei Jia, Shengchang Ji, Yanhua Han, Wensen Wang
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引用次数: 0

摘要

在过去三年中,一些油浸式超高压并联电抗器在投入运行时出现了放电缺陷,导致乙炔过载。然而,在稳态条件下检测和识别这些由开关脉冲电压引起的放电缺陷具有挑战性。这对设备的长期运行和随后的瞬态过程造成了不可预测和难以评估的安全风险。因此,理解开关冲击电压下油压板(PB)绝缘的放电行为并设计出一种识别缺陷的方法变得至关重要。本研究的重点是调查典型缺陷在标准和振荡开关脉冲电压下表现出的频繁电弧重燃(FAR)模式。目的是揭示 FAR 背后的机理,并提出适合瞬态过程的缺陷识别策略。研究发现,击穿过程中至少会出现一次 FAR 过程;在具有弱垂直电场的表面缺陷中,FAR 现象最弱。FAR 过程的平均恢复电压百分比和平均放电间隔随着脉冲振幅或振荡频率的增加而减小。此外,平均放电次数会随着振荡频率的增加而减少,而随着振幅的增加,平均放电次数会先增加后减少。基于对 FAR 过程的数量及其在振幅或放电间隔方面的变化的分析,开发了一种在开关瞬态过程中识别油-PB 缺陷的方法,并成功应用于涉及 1000 kV 并联电抗器中乙炔过载的案例研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Defect recognition of oil-pressboard insulation based on frequent arc reignition phenomenon under switching impulse voltage

Defect recognition of oil-pressboard insulation based on frequent arc reignition phenomenon under switching impulse voltage

In the past three years, a number of oil-immersed ultra-high-voltage shunt reactors have experienced discharge defects when being put into operation, resulting in an overload of acetylene. However, detecting and identifying these discharge defects caused by switching impulse voltage is challenging under steady-state conditions. This poses unpredictable and difficult-to-assess safety risks for the longterm operation of the equipment and subsequent transient processes. Hence, comprehending the discharge behavior of oil-pressboard (PB) insulation under switching impulse voltage and devising a method to identify defects becomes crucial. This study focuses on investigating the frequent arc reignition (FAR) pattern exhibited by typical defects under both standard and oscillation switching impulse voltages. The objective is to uncover the mechanism behind FAR and propose a defect recognition strategy suitable for transient processes. The study reveals the FAR process will occur at least once during the breakdown process; the FAR phenomenon is the weakest in the surface defect with a weak vertical electric field. The average recovery voltage percentage and the average discharge interval of the FAR process decrease with increasing impulse amplitude or oscillation frequency. Additionally, the average number of discharges decreases with higher oscillation frequency, while it initially increases and then decreases with increaseing amplitude. Based on the analysis of the number of FAR processes and their variation in terms of amplitude or discharge interval, a method for recognizing oil-PB defects during switching transient processes is developed and successfully applied to a case study involving acetylene overload in a 1000 kV shunt reactor.

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来源期刊
High Voltage
High Voltage Energy-Energy Engineering and Power Technology
CiteScore
9.60
自引率
27.30%
发文量
97
审稿时长
21 weeks
期刊介绍: High Voltage aims to attract original research papers and review articles. The scope covers high-voltage power engineering and high voltage applications, including experimental, computational (including simulation and modelling) and theoretical studies, which include: Electrical Insulation ● Outdoor, indoor, solid, liquid and gas insulation ● Transient voltages and overvoltage protection ● Nano-dielectrics and new insulation materials ● Condition monitoring and maintenance Discharge and plasmas, pulsed power ● Electrical discharge, plasma generation and applications ● Interactions of plasma with surfaces ● Pulsed power science and technology High-field effects ● Computation, measurements of Intensive Electromagnetic Field ● Electromagnetic compatibility ● Biomedical effects ● Environmental effects and protection High Voltage Engineering ● Design problems, testing and measuring techniques ● Equipment development and asset management ● Smart Grid, live line working ● AC/DC power electronics ● UHV power transmission Special Issues. Call for papers: Interface Charging Phenomena for Dielectric Materials - https://digital-library.theiet.org/files/HVE_CFP_ICP.pdf Emerging Materials For High Voltage Applications - https://digital-library.theiet.org/files/HVE_CFP_EMHVA.pdf
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