{"title":"参考球对里奇-康普法测试精度的影响","authors":"Shuo Zhu, Xiaohui Zhang","doi":"10.1049/ote2.12110","DOIUrl":null,"url":null,"abstract":"<p>The authors analyse the influence of reference sphere on the test accuracy of Ritchey–Common method during testing of flat mirror surface. A simulation model is established to simulate the influence of different radii of curvature of reference sphere on system wavefront. Then, the difference between the flat mirror surface result with reference sphere surface error to the actual flat mirror surface is examined by this model. The test accuracy of flat mirror result can be effectively improved by eliminating the influence of the surface error of reference sphere. When the surface accuracy of the reference sphere is better than 0.01 <i>λ</i>, the influence on RMS test accuracy is within 0.01 <i>λ</i>. R–C test path is built to test a 100 mm-diameter flat mirror surface, and its results are compared with those of the flat mirror surface without surface error of reference sphere and with the test result of the interferometer. When the surface accuracy of the actual used area of reference sphere is better than 0.01 <i>λ</i>, the effect on flat mirror RMS accuracy is within 0.01 <i>λ</i>. The RMS test accuracy can reach 0.01 <i>λ</i>, when the surface error of reference sphere is retained. The experiment verifies the correctness of the simulation results and guarantees the improvement in the test accuracy of R–C method.</p>","PeriodicalId":13408,"journal":{"name":"Iet Optoelectronics","volume":"18 1-2","pages":"1-10"},"PeriodicalIF":2.3000,"publicationDate":"2024-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/ote2.12110","citationCount":"0","resultStr":"{\"title\":\"Influence of reference sphere on test accuracy of Ritchey–Common method\",\"authors\":\"Shuo Zhu, Xiaohui Zhang\",\"doi\":\"10.1049/ote2.12110\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>The authors analyse the influence of reference sphere on the test accuracy of Ritchey–Common method during testing of flat mirror surface. A simulation model is established to simulate the influence of different radii of curvature of reference sphere on system wavefront. Then, the difference between the flat mirror surface result with reference sphere surface error to the actual flat mirror surface is examined by this model. The test accuracy of flat mirror result can be effectively improved by eliminating the influence of the surface error of reference sphere. When the surface accuracy of the reference sphere is better than 0.01 <i>λ</i>, the influence on RMS test accuracy is within 0.01 <i>λ</i>. R–C test path is built to test a 100 mm-diameter flat mirror surface, and its results are compared with those of the flat mirror surface without surface error of reference sphere and with the test result of the interferometer. When the surface accuracy of the actual used area of reference sphere is better than 0.01 <i>λ</i>, the effect on flat mirror RMS accuracy is within 0.01 <i>λ</i>. The RMS test accuracy can reach 0.01 <i>λ</i>, when the surface error of reference sphere is retained. The experiment verifies the correctness of the simulation results and guarantees the improvement in the test accuracy of R–C method.</p>\",\"PeriodicalId\":13408,\"journal\":{\"name\":\"Iet Optoelectronics\",\"volume\":\"18 1-2\",\"pages\":\"1-10\"},\"PeriodicalIF\":2.3000,\"publicationDate\":\"2024-01-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://onlinelibrary.wiley.com/doi/epdf/10.1049/ote2.12110\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Iet Optoelectronics\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1049/ote2.12110\",\"RegionNum\":4,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Iet Optoelectronics","FirstCategoryId":"94","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1049/ote2.12110","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Influence of reference sphere on test accuracy of Ritchey–Common method
The authors analyse the influence of reference sphere on the test accuracy of Ritchey–Common method during testing of flat mirror surface. A simulation model is established to simulate the influence of different radii of curvature of reference sphere on system wavefront. Then, the difference between the flat mirror surface result with reference sphere surface error to the actual flat mirror surface is examined by this model. The test accuracy of flat mirror result can be effectively improved by eliminating the influence of the surface error of reference sphere. When the surface accuracy of the reference sphere is better than 0.01 λ, the influence on RMS test accuracy is within 0.01 λ. R–C test path is built to test a 100 mm-diameter flat mirror surface, and its results are compared with those of the flat mirror surface without surface error of reference sphere and with the test result of the interferometer. When the surface accuracy of the actual used area of reference sphere is better than 0.01 λ, the effect on flat mirror RMS accuracy is within 0.01 λ. The RMS test accuracy can reach 0.01 λ, when the surface error of reference sphere is retained. The experiment verifies the correctness of the simulation results and guarantees the improvement in the test accuracy of R–C method.
期刊介绍:
IET Optoelectronics publishes state of the art research papers in the field of optoelectronics and photonics. The topics that are covered by the journal include optical and optoelectronic materials, nanophotonics, metamaterials and photonic crystals, light sources (e.g. LEDs, lasers and devices for lighting), optical modulation and multiplexing, optical fibres, cables and connectors, optical amplifiers, photodetectors and optical receivers, photonic integrated circuits, photonic systems, optical signal processing and holography and displays.
Most of the papers published describe original research from universities and industrial and government laboratories. However correspondence suggesting review papers and tutorials is welcomed, as are suggestions for special issues.
IET Optoelectronics covers but is not limited to the following topics:
Optical and optoelectronic materials
Light sources, including LEDs, lasers and devices for lighting
Optical modulation and multiplexing
Optical fibres, cables and connectors
Optical amplifiers
Photodetectors and optical receivers
Photonic integrated circuits
Nanophotonics and photonic crystals
Optical signal processing
Holography
Displays