碳化氧钚的光发射研究

Paul Roussel
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引用次数: 0

摘要

碳化氧钚表面薄膜具有延缓氧化的特性。本研究分析的碳化氧钚薄膜的化学计量为 PuC0.5O0.3,在 X 射线光电子能谱探测的深度内是均匀的。利用核级 X 射线光电子能谱和价带紫外线光电子能谱研究了这种碳化钚表面薄膜的电子结构。导带则通过反向光发射光谱进行了探测。核心级 Pu 4f7/2 光谱由两部分组成,分别来自贫终态和良好屏蔽终态。价带光谱显示的峰值可归因于被占据的配体态以及局部和巡回的 Pu 5f 电子行为。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Photoemission study of plutonium oxycarbide
Surface films of plutonium oxycarbide have shown oxidation retardation properties. The plutonium oxycarbide film analyzed in this study has a stoichiometry of PuC0.5O0.3 and is homogenous within the depth probed by x-ray photoelectron spectroscopy. The electronic structure of this plutonium oxycarbide surface film has been investigated using core level x-ray photoelectron spectroscopy and valence band ultraviolet photoelectron spectroscopy. The conduction band has been probed with inverse photoemission spectroscopy. The core level Pu 4f7/2 spectrum consists of two components occurring from the poor and well-screened final states. The valence band spectra display peaks attributable to occupied ligand states and both localized and itinerant Pu 5f electron behavior.
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