D. Sharma, M. Tedaldi, Patrick Hole, A.D.L. Humphris, L. Wouters, T. Hantschel, U. Celano
{"title":"用于材料研究和失效分析的创新型多探针层析原子力显微镜","authors":"D. Sharma, M. Tedaldi, Patrick Hole, A.D.L. Humphris, L. Wouters, T. Hantschel, U. Celano","doi":"10.31399/asm.edfa.2023-4.p020","DOIUrl":null,"url":null,"abstract":"This article describes recent advancements in multi-probe sensing schemes and development of a tomographic atomic force microscopy tool for materials research and failure analysis.","PeriodicalId":431761,"journal":{"name":"EDFA Technical Articles","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An Innovative Multi-Probe Tomographic Atomic Force Microscope for Materials Research and Failure Analysis\",\"authors\":\"D. Sharma, M. Tedaldi, Patrick Hole, A.D.L. Humphris, L. Wouters, T. Hantschel, U. Celano\",\"doi\":\"10.31399/asm.edfa.2023-4.p020\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article describes recent advancements in multi-probe sensing schemes and development of a tomographic atomic force microscopy tool for materials research and failure analysis.\",\"PeriodicalId\":431761,\"journal\":{\"name\":\"EDFA Technical Articles\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"EDFA Technical Articles\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.31399/asm.edfa.2023-4.p020\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"EDFA Technical Articles","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.edfa.2023-4.p020","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Innovative Multi-Probe Tomographic Atomic Force Microscope for Materials Research and Failure Analysis
This article describes recent advancements in multi-probe sensing schemes and development of a tomographic atomic force microscopy tool for materials research and failure analysis.
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