Joshua W. Pinder , George H. Major , Donald R. Baer , Jeff Terry , James E. Whitten , Jan Čechal , Jacob D. Crossman , Alvaro J. Lizarbe , Samira Jafari , Christopher D. Easton , Jonas Baltrusaitis , Matthijs A. van Spronsen , Matthew R. Linford
{"title":"避免 X 射线光电子能谱数据收集和分析中的常见错误，正确报告仪器参数","authors":"Joshua W. Pinder , George H. Major , Donald R. Baer , Jeff Terry , James E. Whitten , Jan Čechal , Jacob D. Crossman , Alvaro J. Lizarbe , Samira Jafari , Christopher D. Easton , Jonas Baltrusaitis , Matthijs A. van Spronsen , Matthew R. Linford","doi":"10.1016/j.apsadv.2023.100534","DOIUrl":null,"url":null,"abstract":"<div><p>Despite numerous tutorials and standards written to the technical community on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting persist. This work focuses on common errors in XPS that are frequently observed in the scientific literature and their sources. Indeed, this work covers: (i) XPS data collection, initial data analysis, and data presentation, (ii) Handling XPS backgrounds, (iii) Common errors in XPS peak fitting, and (iv) XPS data presentation and reporting. Graphical examples of errors and appropriate ways of handling data and correcting errors are provided. Additional readings are listed for greater in-depth exploration of the subjects discussed.</p></div>","PeriodicalId":34303,"journal":{"name":"Applied Surface Science Advances","volume":"19 ","pages":"Article 100534"},"PeriodicalIF":7.5000,"publicationDate":"2024-01-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S266652392300168X/pdfft?md5=e57aaca73b0efffa3b886dd92134f6aa&pid=1-s2.0-S266652392300168X-main.pdf","citationCount":"0","resultStr":"{\"title\":\"Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters\",\"authors\":\"Joshua W. Pinder , George H. Major , Donald R. Baer , Jeff Terry , James E. Whitten , Jan Čechal , Jacob D. Crossman , Alvaro J. Lizarbe , Samira Jafari , Christopher D. Easton , Jonas Baltrusaitis , Matthijs A. van Spronsen , Matthew R. Linford\",\"doi\":\"10.1016/j.apsadv.2023.100534\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Despite numerous tutorials and standards written to the technical community on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting persist. This work focuses on common errors in XPS that are frequently observed in the scientific literature and their sources. Indeed, this work covers: (i) XPS data collection, initial data analysis, and data presentation, (ii) Handling XPS backgrounds, (iii) Common errors in XPS peak fitting, and (iv) XPS data presentation and reporting. Graphical examples of errors and appropriate ways of handling data and correcting errors are provided. Additional readings are listed for greater in-depth exploration of the subjects discussed.</p></div>\",\"PeriodicalId\":34303,\"journal\":{\"name\":\"Applied Surface Science Advances\",\"volume\":\"19 \",\"pages\":\"Article 100534\"},\"PeriodicalIF\":7.5000,\"publicationDate\":\"2024-01-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.sciencedirect.com/science/article/pii/S266652392300168X/pdfft?md5=e57aaca73b0efffa3b886dd92134f6aa&pid=1-s2.0-S266652392300168X-main.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Applied Surface Science Advances\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S266652392300168X\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"CHEMISTRY, PHYSICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Surface Science Advances","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S266652392300168X","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters
Despite numerous tutorials and standards written to the technical community on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting persist. This work focuses on common errors in XPS that are frequently observed in the scientific literature and their sources. Indeed, this work covers: (i) XPS data collection, initial data analysis, and data presentation, (ii) Handling XPS backgrounds, (iii) Common errors in XPS peak fitting, and (iv) XPS data presentation and reporting. Graphical examples of errors and appropriate ways of handling data and correcting errors are provided. Additional readings are listed for greater in-depth exploration of the subjects discussed.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
