{"title":"双面硅异质结太阳能组件中的电位诱导退化:见解和缓解策略","authors":"Olatz Arriaga Arruti, Luca Gnocchi, Quentin Jeangros, Christophe Ballif, Alessandro Virtuani","doi":"10.1002/pip.3765","DOIUrl":null,"url":null,"abstract":"<p>Potential-induced degradation (PID) may be a serious concern in photovoltaic (PV) modules and plants, particularly when approaching high system voltages (1500+ V). Here, we investigate PID occurring in bifacial rear-emitter silicon heterojunction (SHJ) solar cells encapsulated in a glass/glass (G/G) module configuration with ethylene vinyl acetate (EVA) as an encapsulant. PID testing was performed at 85°C in 85% relative humidity (RH), and the solar cells were subjected to −1 kV and +1 kV for up to 800 h. SHJ cells were found to degrade when subjected to −1 kV, and to a lesser extent when left unbiased in damp heat (DH) conditions, while the application of +1 kV prevented degradation. Although prone to PID after extended test durations, the SHJ mini-modules investigated in this study noticeably passed the industry standard (IEC 61215:2021) PID test of 96 h. The degradation was primarily characterized by losses in short-circuit current (I<sub>SC</sub>) at the front side, followed by fill factor (FF) and open-circuit voltage (V<sub>OC</sub>). A cross-sectional transmission electronic microscopy analysis of the laminates subjected to −1 kV highlighted a transport of sodium (Na) through the transparent conductive oxide (TCO), reaching the amorphous Si/TCO interface. The samples tested in DH conditions and with positive PID test conditions did not exhibit such a migration of Na. To account for these observations, we updated a previously proposed model describing the sensitivity of SHJ cells to water. In our degradation model, moisture in the module corrodes the glass, creating sodium hydroxide (NaOH) that then percolate through the EVA before reaching the SHJ cell. The application of a high negative bias amplifies the previous mechanism by increasing the availability of Na<sup>+</sup> and also enhances the drift of Na<sup>+</sup> through the EVA to the cell. Finally, we demonstrate that PID can be mitigated or suppressed at the module level by using a high-volume resistivity encapsulant with a low water vapor transmission rate (WVTR) or by encapsulating SHJ solar cells in a configuration impermeable to water (e.g., using an edge sealant).</p>","PeriodicalId":223,"journal":{"name":"Progress in Photovoltaics","volume":"32 5","pages":"304-316"},"PeriodicalIF":8.0000,"publicationDate":"2023-12-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Potential-induced degradation in bifacial silicon heterojunction solar modules: Insights and mitigation strategies\",\"authors\":\"Olatz Arriaga Arruti, Luca Gnocchi, Quentin Jeangros, Christophe Ballif, Alessandro Virtuani\",\"doi\":\"10.1002/pip.3765\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Potential-induced degradation (PID) may be a serious concern in photovoltaic (PV) modules and plants, particularly when approaching high system voltages (1500+ V). Here, we investigate PID occurring in bifacial rear-emitter silicon heterojunction (SHJ) solar cells encapsulated in a glass/glass (G/G) module configuration with ethylene vinyl acetate (EVA) as an encapsulant. PID testing was performed at 85°C in 85% relative humidity (RH), and the solar cells were subjected to −1 kV and +1 kV for up to 800 h. SHJ cells were found to degrade when subjected to −1 kV, and to a lesser extent when left unbiased in damp heat (DH) conditions, while the application of +1 kV prevented degradation. Although prone to PID after extended test durations, the SHJ mini-modules investigated in this study noticeably passed the industry standard (IEC 61215:2021) PID test of 96 h. The degradation was primarily characterized by losses in short-circuit current (I<sub>SC</sub>) at the front side, followed by fill factor (FF) and open-circuit voltage (V<sub>OC</sub>). A cross-sectional transmission electronic microscopy analysis of the laminates subjected to −1 kV highlighted a transport of sodium (Na) through the transparent conductive oxide (TCO), reaching the amorphous Si/TCO interface. The samples tested in DH conditions and with positive PID test conditions did not exhibit such a migration of Na. To account for these observations, we updated a previously proposed model describing the sensitivity of SHJ cells to water. In our degradation model, moisture in the module corrodes the glass, creating sodium hydroxide (NaOH) that then percolate through the EVA before reaching the SHJ cell. The application of a high negative bias amplifies the previous mechanism by increasing the availability of Na<sup>+</sup> and also enhances the drift of Na<sup>+</sup> through the EVA to the cell. Finally, we demonstrate that PID can be mitigated or suppressed at the module level by using a high-volume resistivity encapsulant with a low water vapor transmission rate (WVTR) or by encapsulating SHJ solar cells in a configuration impermeable to water (e.g., using an edge sealant).</p>\",\"PeriodicalId\":223,\"journal\":{\"name\":\"Progress in Photovoltaics\",\"volume\":\"32 5\",\"pages\":\"304-316\"},\"PeriodicalIF\":8.0000,\"publicationDate\":\"2023-12-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Progress in Photovoltaics\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1002/pip.3765\",\"RegionNum\":2,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENERGY & FUELS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Progress in Photovoltaics","FirstCategoryId":"88","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/pip.3765","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENERGY & FUELS","Score":null,"Total":0}
Potential-induced degradation in bifacial silicon heterojunction solar modules: Insights and mitigation strategies
Potential-induced degradation (PID) may be a serious concern in photovoltaic (PV) modules and plants, particularly when approaching high system voltages (1500+ V). Here, we investigate PID occurring in bifacial rear-emitter silicon heterojunction (SHJ) solar cells encapsulated in a glass/glass (G/G) module configuration with ethylene vinyl acetate (EVA) as an encapsulant. PID testing was performed at 85°C in 85% relative humidity (RH), and the solar cells were subjected to −1 kV and +1 kV for up to 800 h. SHJ cells were found to degrade when subjected to −1 kV, and to a lesser extent when left unbiased in damp heat (DH) conditions, while the application of +1 kV prevented degradation. Although prone to PID after extended test durations, the SHJ mini-modules investigated in this study noticeably passed the industry standard (IEC 61215:2021) PID test of 96 h. The degradation was primarily characterized by losses in short-circuit current (ISC) at the front side, followed by fill factor (FF) and open-circuit voltage (VOC). A cross-sectional transmission electronic microscopy analysis of the laminates subjected to −1 kV highlighted a transport of sodium (Na) through the transparent conductive oxide (TCO), reaching the amorphous Si/TCO interface. The samples tested in DH conditions and with positive PID test conditions did not exhibit such a migration of Na. To account for these observations, we updated a previously proposed model describing the sensitivity of SHJ cells to water. In our degradation model, moisture in the module corrodes the glass, creating sodium hydroxide (NaOH) that then percolate through the EVA before reaching the SHJ cell. The application of a high negative bias amplifies the previous mechanism by increasing the availability of Na+ and also enhances the drift of Na+ through the EVA to the cell. Finally, we demonstrate that PID can be mitigated or suppressed at the module level by using a high-volume resistivity encapsulant with a low water vapor transmission rate (WVTR) or by encapsulating SHJ solar cells in a configuration impermeable to water (e.g., using an edge sealant).
期刊介绍:
Progress in Photovoltaics offers a prestigious forum for reporting advances in this rapidly developing technology, aiming to reach all interested professionals, researchers and energy policy-makers.
The key criterion is that all papers submitted should report substantial “progress” in photovoltaics.
Papers are encouraged that report substantial “progress” such as gains in independently certified solar cell efficiency, eligible for a new entry in the journal''s widely referenced Solar Cell Efficiency Tables.
Examples of papers that will not be considered for publication are those that report development in materials without relation to data on cell performance, routine analysis, characterisation or modelling of cells or processing sequences, routine reports of system performance, improvements in electronic hardware design, or country programs, although invited papers may occasionally be solicited in these areas to capture accumulated “progress”.