Genetic mapping of quantitative trait loci controlling smut resistance in Louisiana sugarcane using a bi-parental mapping population

Sugarcane smut, caused by Sporisorium scitamineum, is a major disease worldwide. Breeding resistant cultivars is the main management strategy. However, occasional failure to detect susceptible clones due to unfavorable environmental conditions, inconsistency in disease ratings between experiments, and continued clone losses due to pathogen adaptability are some of the challenges for this strategy. The development and use of molecular markers associated with smut resistance may overcome these limitations allowing more accurate identification of resistant parents and progeny. A genetic analysis was conducted using an inoculated population of 162 F₁ progeny from a biparental cross between susceptible/female and resistant/male parents to identify quantitative trait loci (QTLs) associated with resistance. A total of 1574 single dose (SD) single-nucleotide polymorphisms (SNP) markers used to construct a genetic map resulted in 253 linkage groups (LGs) of which 150 LGs were assigned to the female parent and 204 LG to the male parent with a genome coverage of 24,580 cM. (Composite) interval mapping with selective sub-populations identified six consistent QTLs that cumulatively explained 25.74% of the phenotypic variance with LOD scores ranging from 3.17 to 23.7. Four out of 12 SNP markers closest to the QTL peaks had effect >10 for resistance in the heterozygous condition. Genes known to be involved in disease resistance, such as cellulose synthase, expansin, protein degradation, and receptor-kinase were linked to the genomic regions associated with smut resistance. The markers upon validation in different populations can be utilized for marker-assisted selection.