基于自动编码器网络的 SICM 快速扫描方法

IF 2.5 3区 工程技术 Q1 MICROSCOPY
Wenlin Wu , Xiaobo Liao , Lei Wang , Siyu Chen , Jian Zhuang , Qiangqiang Zheng
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引用次数: 0

摘要

扫描离子电导显微镜(SICM)可对活细胞进行无损成像,因此在生命科学、医学、药理学等众多领域具有极高的应用价值。然而,由于 SICM 跳转模式的回溯高度不确定,SICM 的时间分辨率相对较低,导致该设备无法满足动态扫描的需求。针对上述问题,我们提出了一种基于自动编码器网络的 SICM 快速扫描方法。首先,我们将采样不足的图像切割成小图像列表。其次,我们将其输入一个自建的原始自动编码器超分辨率网络,以计算高分辨率图像。最后,利用计算出的图像确定推断的扫描路径,重建真实的高分辨率扫描路径。结果表明,在各种低分辨率扫描图像的超分辨任务中,所提出的网络可以重建更高分辨率的图像。与现有的传统插值方法相比,平均峰值信噪比提高了 7.5823 dB,平均结构相似度指数提高了 0.2372。同时,与传统方法相比,使用所提出的方法进行高分辨率图像扫描的速度提高了 156.25%。这为在 SICM 中实现动态样本的高时间分辨率成像提供了可能,并进一步推动了 SICM 在未来的广泛应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Rapid scanning method for SICM based on autoencoder network

Scanning Ion Conductance Microscopy (SICM) enables non-destructive imaging of living cells, which makes it highly valuable in life sciences, medicine, pharmacology, and many other fields. However, because of the uncertainty retrace height of SICM hopping mode, the time resolution of SICM is relatively low, which makes the device fail to meet the demands of dynamic scanning. To address above issues, we propose a fast-scanning method for SICM based on an autoencoder network. Firstly, we cut under-sampled images into small image lists. Secondly, we feed them into a self-constructed primitive-autoencoder super-resolution network to compute high-resolution images. Finally, the inferred scanning path is determined using the computed images to reconstruct the real high-resolution scanning path. The results demonstrate that the proposed network can reconstruct higher-resolution images in various super-resolution tasks of low-resolution scanned images. Compared to existing traditional interpolation methods, the average peak signal-to-noise ratio improvement is greater than 7.5823 dB, and the average structural similarity index improvement is greater than 0.2372. At the same time, using the proposed method for high-resolution image scanning leads to a 156.25% speed improvement compared to traditional methods. It opens up possibilities for achieving high-time resolution imaging of dynamic samples in SICM and further promotes the widespread application of SICM in the future.

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来源期刊
Micron
Micron 工程技术-显微镜技术
CiteScore
4.30
自引率
4.20%
发文量
100
审稿时长
31 days
期刊介绍: Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.
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