开发用于分析 X 射线反射率数据的贝叶斯推理方法

IF 1.5 4区物理与天体物理 Q3 PHYSICS, APPLIED

Japanese Journal of Applied Physics Pub Date : 2023-12-21 DOI:10.35848/1347-4065/ad17de

Atsushi Machida, Takeshi Watanabe, M. Mizumaki, K. Nagata, M. Okada

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引用次数: 0

摘要

X 射线反射率是材料科学各领域用于研究固体表面物理性质和界面结构的一种实验方法。然而，评估用这种方法获得的估计值的可靠性却非常困难。在本研究中，我们提出了一种使用贝叶斯推断法分析 X 射线反射率数据的方法。贝叶斯推断法可以评估估计值的不确定性，也可以评估测量极限，同时还表明即使在有噪声的情况下也可以进行估计。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Development of a Bayesian inference method for the analysis of X-ray reﬂectivity data

X-ray reﬂectivity is an experimental method used in various ﬁelds of materials science to investigate the physical properties of solid surfaces and the structure of interfaces. However, it is diﬃcult to evaluate the reliability of the estimates obtained with this method. In this study, we propose a method for analyzing X-ray reﬂectivity data using Bayesian inference. Bayesian inference allows the uncertainty of the estimate to be evaluated, which also allows the measurement limit to be evaluated, and also shows that estimation is possible even in noisy situations.

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来源期刊

Japanese Journal of Applied Physics 物理-物理：应用

CiteScore

3.00

自引率

26.70%

发文量

818

审稿时长

3.5 months

期刊介绍： The Japanese Journal of Applied Physics (JJAP) is an international journal for the advancement and dissemination of knowledge in all fields of applied physics. JJAP is a sister journal of the Applied Physics Express (APEX) and is published by IOP Publishing Ltd on behalf of the Japan Society of Applied Physics (JSAP). JJAP publishes articles that significantly contribute to the advancements in the applications of physical principles as well as in the understanding of physics in view of particular applications in mind. Subjects covered by JJAP include the following fields: • Semiconductors, dielectrics, and organic materials • Photonics, quantum electronics, optics, and spectroscopy • Spintronics, superconductivity, and strongly correlated materials • Device physics including quantum information processing • Physics-based circuits and systems • Nanoscale science and technology • Crystal growth, surfaces, interfaces, thin films, and bulk materials • Plasmas, applied atomic and molecular physics, and applied nuclear physics • Device processing, fabrication and measurement technologies, and instrumentation • Cross-disciplinary areas such as bioelectronics/photonics, biosensing, environmental/energy technologies, and MEMS