更正：通过 U-Net 对明视场透射电子显微镜图像进行晶界自动检测。

{"title":"更正：通过 U-Net 对明视场透射电子显微镜图像进行晶界自动检测。","authors":"","doi":"10.1093/micmic/ozad140","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":"632"},"PeriodicalIF":2.9000,"publicationDate":"2024-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Correction to: Automated Grain Boundary Detection for Bright-Field Transmission Electron Microscopy Images via U-Net.\",\"authors\":\"\",\"doi\":\"10.1093/micmic/ozad140\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":18625,\"journal\":{\"name\":\"Microscopy and Microanalysis\",\"volume\":\" \",\"pages\":\"632\"},\"PeriodicalIF\":2.9000,\"publicationDate\":\"2024-07-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microscopy and Microanalysis\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1093/micmic/ozad140\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microscopy and Microanalysis","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1093/micmic/ozad140","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}