教育 I&M:从直接数字合成器的输出中看到相位截断刺

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
S. Engelberg
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引用次数: 0

摘要

在进行测量时,通常重要的是要有一个信号发生器,输出精确的正弦波,可以用作被测系统的输入。一个很好的,概念上简单的方法来实现这样的仪器是利用直接数字合成。使用这种技术的合成器有许多很好的功能,如下所述。例如,它们可以在不同的频率之间快速切换,并产生非常好的输出。不幸的是,它们的输出包含在频率以外的小频谱成分。例如,作为合成器一部分的数模转换器的非线性产生的分量,时钟馈通产生的分量,以及相位截断杂散产生的分量[1],[2]。在这个讲座/实验笔记中,我们将研究相位截断杂散。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Education I&M: Seeing Phase Truncation Spurs in the Output of Direct Digital Synthesizers
When making measurements, it is often important to have a signal generator that outputs accurate sine waves that can be used as inputs to the system under test. One nice, conceptually simple way to implement such an instrument is to make use of direct digital synthesis. Synthesizers that use this technique, described below, have many nice features. For example, they can switch between different frequencies quickly, and they produce very nice output. Unfortunately, their output contains small spectral components at frequencies other than the desired one. There are, for example, components due to the nonlinearity of the digital to analog converter used as part of the synthesizer, components due to clock feedthrough, and components due to phase truncation spurs [1], [2]. In this lecture/lab note we examine phase truncation spurs.
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来源期刊
IEEE Instrumentation & Measurement Magazine
IEEE Instrumentation & Measurement Magazine 工程技术-工程:电子与电气
CiteScore
4.20
自引率
4.80%
发文量
147
审稿时长
>12 weeks
期刊介绍: IEEE Instrumentation & Measurement Magazine is a bimonthly publication. It publishes in February, April, June, August, October, and December of each year. The magazine covers a wide variety of topics in instrumentation, measurement, and systems that measure or instrument equipment or other systems. The magazine has the goal of providing readable introductions and overviews of technology in instrumentation and measurement to a wide engineering audience. It does this through articles, tutorials, columns, and departments. Its goal is to cross disciplines to encourage further research and development in instrumentation and measurement.
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