利用基于特征模式分析的矩阵方法逼近直流注入高强度辐射场

IF 0.6 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Jan Ückerseifer, Frank Gronwald
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引用次数: 1

摘要

摘要。本文以高强度辐射场(HIRF)和基于表面电流分析的直流注入(DCI)为例,讨论了传导抗扰度试验的辐射近似。为此,采用特征模态分析(CMA)为特征模态下的表面电流扩展提供基函数。利用HIRF和DCI试验装置的特征模态数据,通过基于矩阵的基变换算法,推导出合适的DCI表面电流。在较宽的频率范围内,分析了用计算得到的DCI表面电流近似HIRF表面电流。在这个频率范围内,确定了导致HIRF电流最佳近似的DCI频率。结合DCI测试中的实际问题,阐述了DCI适配器参数对表面电流近似的影响。数值结果表明,在低频时,DCI可以在很大程度上与DCI适配器的设置无关,而在高频时则难以实现近似。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Approximation of High Intensity Radiated Field by Direct Current Injection using matrix methods based on Characteristic Mode Analysis
Abstract. This contribution discusses the approximation of radiated by conducted immunity tests by the example of High Intensity Radiated Field (HIRF) and Direct Current Injection (DCI) based on a surface current analysis. For this purpose, Characteristic Mode Analysis (CMA) is applied to provide basis functions for a surface current expansion in Characteristic Modes. Via a matrix-based basis transformation algorithm involving Characteristic Mode data of both HIRF and DCI test setups, suitable DCI surface currents are derived. The approximation of HIRF surface currents by the computed DCI surface currents is analyzed for exemplary DUTs over a broad frequency range. Within this frequency range, those DCI frequencies leading to an optimal approximation of the HIRF current are determined. Concerning practical issues in DCI testing, the influence of DCI adapter parameters on the surface current approximation is elucidated. The numerical results show that DCI can approximate HIRF at low frequencies largely independent from the DCI adapter setting, whereas at high frequencies an approximation is difficult to realize.
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来源期刊
Advances in Radio Science
Advances in Radio Science ENGINEERING, ELECTRICAL & ELECTRONIC-
CiteScore
0.90
自引率
0.00%
发文量
3
审稿时长
45 weeks
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