透视钛取代对 (Hf,Ti)C 在 2500 °C 下静态氧化行为的影响

Shiyan Chen , Zhaoke Chen , Jinming Wang , Yi Zeng , Weilong Song , Xiang Xiong , Xingchao Li , Tongqi Li , Yichen Wang
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引用次数: 0

摘要

在2000℃以上的氧化环境中,hf基碳化物是非常理想的候选材料。然而,在其潜在使用温度下的静态氧化行为仍不清楚。为了填补这一空白,在2500℃的空气中,在4.2 kPa的氧分压下,研究了(Hf, Ti)C的静态氧化行为和Ti取代的影响。氧化2000 s后,(Hf, Ti)C本体陶瓷表面的氧化层厚度比氢氟碳化物表面的氧化层厚度减少了62.29%。抗氧化性能的显著提高归功于独特的氧化层结构,由各种结晶碳化物,HfO2和碳组成。分散在HfO2中的富Ti碳化物氧((Ti, Hf)CxOy)形成了氧化层的主要结构。在HfO2/(Ti, Hf)CxOy界面沿(111)晶面方向存在晶格畸变的相干边界,是有效的氧扩散屏障。富Hf碳化物氧((Hf, Ti)CxOy)与(Ti, Hf)CxOy、HfO2、析出碳构成致密的过渡层,保证了氧化层与基体的良好结合。Ti含量通过决定氧化层的相分布和完整性来影响(Hf, Ti)C的抗氧化性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Insight into the effect of Ti substitutions on the static oxidation behavior of (Hf,Ti)C at 2500 ​°C

Insight into the effect of Ti substitutions on the static oxidation behavior of (Hf,Ti)C at 2500 ​°C

Hf-based carbides are highly desirable candidate materials for oxidizing environments above 2000 ​°C. However, the static oxidation behavior at their potential service temperatures remains unclear. To fill this gap, the static oxidation behavior of (Hf, Ti)C and the effect of Ti substitutions were investigated in air at 2500 ​°C under an oxygen partial pressure of 4.2 ​kPa. After oxidation for 2000 ​s, the thickness of the oxide layer on the surface of (Hf, Ti)C bulk ceramic is reduced by 62.29 ​% compared with that on the HfC monocarbide surface. The dramatic improvement in oxidation resistance is attributed to the unique oxide layer structure consisting of various crystalline oxycarbides, HfO2, and carbon. The Ti-rich oxycarbide ((Ti, Hf)CxOy) dispersed within HfO2 formed the major structure of the oxide layer. A coherent boundary with lattice distortion existed at the HfO2/(Ti, Hf)CxOy interface along the (111) crystal plane direction, which served as an effective oxygen diffusion barrier. The Hf-rich oxycarbide ((Hf, Ti)CxOy) together with (Ti, Hf)CxOy, HfO2, and precipitated carbon constituted a dense transition layer, ensuring favorable bonding between the oxide layer and the matrix. The Ti content affects the oxidation resistance of (Hf, Ti)C by determining the oxide layer's phase distribution and integrity.

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