基于单个有源块的电子可控浮动薄膜电感器和薄膜电容器仿真器

IF 0.5 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
M. Tatović, P. B. Petrovic
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引用次数: 0

摘要

. 本文介绍了两种采用单有源模块的新型仿真电路。第一个电路利用一个电压差跨导放大器(VDTA)来模拟一个浮动/接地的增量/递减磁控记忆电感的行为。第二个电路,基于电压差电流传送带(VDCC),模拟memo -电容的特性。这两种仿真电路都使用电容器作为唯一一种接地无源元件。值得注意的是,这些电路具有电子可调性,能够控制所实现的逆mem电感/ mem电容。所提出的仿真器的理论分析包括对潜在非理想性和寄生效应的研究。通过仔细选择无源电路元件,努力使这些不良影响最小化。与文献中记载的现有设计相比,所提出的电路表现出非凡的简单性。此外,它们具有宽频率可操作性(高达50 MHz),并成功通过非挥发性测试。采用0.18 μm CMOS工艺和±0.9 V电源电压进行的仿真结果与理论预测基本一致。此外,采用蒙特卡罗仿真和拐角分析来评估电路的鲁棒性。为了验证所建议的解决方案的可行性,使用市售组件进行了实验测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Single Active Block-Based Emulators for Electronically Controllable Floating Meminductors and Memcapacitors
. This paper introduces two novel emulator circuits that employ a single active block. The first circuit utilizes a Voltage Differencing Transconductance Amplifier (VDTA) to emulate the behavior of a floating/grounded incremental/decremental flux-controlled meminductor. The second circuit, based on a Voltage Differencing Current Conveyor (VDCC), emulates the characteristics of mem-capacitance. Both emulation circuits are constructed using capacitors as the only type of grounded passive element. Notably, these circuits possess electronic tunability, enabling control over the realized inverse meminduct-ance/memcapacitance. The theoretical analysis of the proposed emulators includes an investigation into potential non-idealities and parasitic effects. By carefully selecting the passive circuit elements, efforts were made to minimize the impact of these unwanted effects. In comparison to existing designs documented in the literature, the proposed circuits demonstrate remarkable simplicity. Additionally, they exhibit wide frequency operability (up to 50 MHz) and successfully pass the non-volatility test. Simulation results conducted using 0.18 μm CMOS technology and a ±0.9 V supply voltage align closely with the theoretical predictions. Furthermore, Monte Carlo simulations and corner analysis are employed to evaluate the circuit's robustness. To validate the feasibility of the proposed solution, experimental tests are performed using commercially available components.
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来源期刊
Radioengineering
Radioengineering 工程技术-工程:电子与电气
CiteScore
2.00
自引率
9.10%
发文量
0
审稿时长
5.7 months
期刊介绍: Since 1992, the Radioengineering Journal has been publishing original scientific and engineering papers from the area of wireless communication and application of wireless technologies. The submitted papers are expected to deal with electromagnetics (antennas, propagation, microwaves), signals, circuits, optics and related fields. Each issue of the Radioengineering Journal is started by a feature article. Feature articles are organized by members of the Editorial Board to present the latest development in the selected areas of radio engineering. The Radioengineering Journal makes a maximum effort to publish submitted papers as quickly as possible. The first round of reviews should be completed within two months. Then, authors are expected to improve their manuscript within one month. If substantial changes are recommended and further reviews are requested by the reviewers, the publication time is prolonged.
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