Sheng He, Yang Li, Li-Guang Wu, Rui-Ping Liu, Dong-Fa Guo, Zi-Ying Li, Xian-Hua Li
{"title":"锡石氧同位素显微分析的新工作参考材料","authors":"Sheng He, Yang Li, Li-Guang Wu, Rui-Ping Liu, Dong-Fa Guo, Zi-Ying Li, Xian-Hua Li","doi":"10.1002/sia.7279","DOIUrl":null,"url":null,"abstract":"Cassiterite is the principal ore mineral for tin, and its oxygen isotope is a promising proxy to trace the origin and evolution of ore-forming fluids, which requires precise and accurate oxygen isotopic analysis. Secondary ion mass spectrometry (SIMS) is a powerful tool for oxygen isotope analysis, especially when samples bear complicated textures, but matrix-matched reference materials are critical for accurate microanalysis. The only available matrix-matched reference material for cassiterite oxygen isotope analysis is Yongde-Cst, and more reference materials are required. Here, we report Piaotang-Cst as a potential working reference material for cassiterite oxygen isotope microanalysis. Our extensive SIMS microanalysis confirmed that Piaotang-Cst is relatively homogeneous, with an average two standard deviations (2SD) of 0.49‰ (<i>n</i> = 626). The δ<sup>18</sup>O<sub>VSMOW</sub> value of Piaotang-Cst is 5.33 ± 0.07‰ (2SD, <i>n</i> = 5) as determined by a conventional fluorination isotope ratio mass spectrometer. We also demonstrated that there is no measurable matrix effect caused by the variable contents of trace elements for cassiterite oxygen isotope microanalysis. We proposed that the Piaotang-Cst can be used as a working reference material for monitoring the external reproducibility and accuracy of SIMS analysis.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":1.6000,"publicationDate":"2023-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A new working reference material for cassiterite oxygen isotope microanalysis\",\"authors\":\"Sheng He, Yang Li, Li-Guang Wu, Rui-Ping Liu, Dong-Fa Guo, Zi-Ying Li, Xian-Hua Li\",\"doi\":\"10.1002/sia.7279\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Cassiterite is the principal ore mineral for tin, and its oxygen isotope is a promising proxy to trace the origin and evolution of ore-forming fluids, which requires precise and accurate oxygen isotopic analysis. Secondary ion mass spectrometry (SIMS) is a powerful tool for oxygen isotope analysis, especially when samples bear complicated textures, but matrix-matched reference materials are critical for accurate microanalysis. The only available matrix-matched reference material for cassiterite oxygen isotope analysis is Yongde-Cst, and more reference materials are required. Here, we report Piaotang-Cst as a potential working reference material for cassiterite oxygen isotope microanalysis. Our extensive SIMS microanalysis confirmed that Piaotang-Cst is relatively homogeneous, with an average two standard deviations (2SD) of 0.49‰ (<i>n</i> = 626). The δ<sup>18</sup>O<sub>VSMOW</sub> value of Piaotang-Cst is 5.33 ± 0.07‰ (2SD, <i>n</i> = 5) as determined by a conventional fluorination isotope ratio mass spectrometer. We also demonstrated that there is no measurable matrix effect caused by the variable contents of trace elements for cassiterite oxygen isotope microanalysis. We proposed that the Piaotang-Cst can be used as a working reference material for monitoring the external reproducibility and accuracy of SIMS analysis.\",\"PeriodicalId\":22062,\"journal\":{\"name\":\"Surface and Interface Analysis\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":1.6000,\"publicationDate\":\"2023-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Surface and Interface Analysis\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://doi.org/10.1002/sia.7279\",\"RegionNum\":4,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"CHEMISTRY, PHYSICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Surface and Interface Analysis","FirstCategoryId":"92","ListUrlMain":"https://doi.org/10.1002/sia.7279","RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
A new working reference material for cassiterite oxygen isotope microanalysis
Cassiterite is the principal ore mineral for tin, and its oxygen isotope is a promising proxy to trace the origin and evolution of ore-forming fluids, which requires precise and accurate oxygen isotopic analysis. Secondary ion mass spectrometry (SIMS) is a powerful tool for oxygen isotope analysis, especially when samples bear complicated textures, but matrix-matched reference materials are critical for accurate microanalysis. The only available matrix-matched reference material for cassiterite oxygen isotope analysis is Yongde-Cst, and more reference materials are required. Here, we report Piaotang-Cst as a potential working reference material for cassiterite oxygen isotope microanalysis. Our extensive SIMS microanalysis confirmed that Piaotang-Cst is relatively homogeneous, with an average two standard deviations (2SD) of 0.49‰ (n = 626). The δ18OVSMOW value of Piaotang-Cst is 5.33 ± 0.07‰ (2SD, n = 5) as determined by a conventional fluorination isotope ratio mass spectrometer. We also demonstrated that there is no measurable matrix effect caused by the variable contents of trace elements for cassiterite oxygen isotope microanalysis. We proposed that the Piaotang-Cst can be used as a working reference material for monitoring the external reproducibility and accuracy of SIMS analysis.
期刊介绍:
Surface and Interface Analysis is devoted to the publication of papers dealing with the development and application of techniques for the characterization of surfaces, interfaces and thin films. Papers dealing with standardization and quantification are particularly welcome, and also those which deal with the application of these techniques to industrial problems. Papers dealing with the purely theoretical aspects of the technique will also be considered. Review articles will be published; prior consultation with one of the Editors is advised in these cases. Papers must clearly be of scientific value in the field and will be submitted to two independent referees. Contributions must be in English and must not have been published elsewhere, and authors must agree not to communicate the same material for publication to any other journal. Authors are invited to submit their papers for publication to John Watts (UK only), Jose Sanz (Rest of Europe), John T. Grant (all non-European countries, except Japan) or R. Shimizu (Japan only).