循环加载试验后首次全尺寸高 Jc Nb3Sn 电缆导管导体的金相学研究

IF 5.6 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Chao Dai , Yunhao Liu , Zichuan Guo , Yu Wu , Arend Nijhuis , Tianjun Xue , Zuojiafeng Wu , Jinggang Qin
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引用次数: 0

摘要

为了验证在聚变磁体中应用高 Jc Nb3Sn 股的可行性,在瑞士 SPC 的 SULTAN 设备中制造并测试了具有短扭距 (STP) 电缆模式的全尺寸电缆导管 (CICC)。对样品逐步施加了三个级别的循环电磁(EM)负载,在电磁负载增加到 80 kA × 10.8 T 之前,没有观察到明显的分流温度(Tcs)下降,之后 Tcs 随着电磁循环急剧下降,这表明超导股发生了不可逆的变形,导致应变状态发生变化,甚至损坏。为探究导体性能下降的原因,对测试导体进行了金相解剖观察。从其中一条腿上提取了承受不同电磁载荷的八段,分析并比较了电缆横截面的几何特征变化。发现 Tcs 的下降与电缆横截面的变形之间存在良好的相关性。在电磁载荷最大的区段中,钢绞线的子元件上发现了大量裂纹,但其他区段的裂纹数量要少得多。综合分析结果,可以推测该导体导致不可逆退化的临界电磁载荷在 850 kN/m 至 870 kN/m 之间。这些结果可作为高 Jc Nb3Sn CICC 设计的参考。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Metallographic investigation of first full-size high-Jc Nb3Sn cable-in-conduit conductor after cyclic loading tests

In order to verify the feasibility of applying high-Jc Nb3Sn strand in fusion magnet, a full-size cable-in-conduit conductor (CICC) with short twist pitch (STP) cable pattern was manufactured and tested in SULTAN facility at SPC, Switzerland. Three levels of cyclic electromagnetic (EM) load were applied on the sample stepwise, no visible decrease of current sharing temperature (Tcs) was observed until the EM load increased to 80 kA × 10.8 T, after that the Tcs decreased dramatically with the EM cycles, which suggested that irreversible deformation, causing a change in the strain state, or even damage has occurred in the superconducting strands. For investigating the reason which caused the conductor performance degradation, the tested conductor was dissected for metallographic observation. Eight segments which subjected to different EM loads were extracted from one of the legs, the geometric feature changes of the cable cross-sections were analyzed and compared. A good correlation was found between the decrease of the Tcs and deformation of the cable cross section. A mass of cracks were found on the sub-elements of strands in the segment which subjected to highest EM load, but the amount of crack is much lower in other segments. Combining the analyses, it is speculated that the critical EM load which causes irreversible degradation is between 850 kN/m and 870 kN/m for this conductor. The results could be a reference in high-Jc Nb3Sn CICC design.

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