{"title":"CMI用爱泼斯坦框架测量高达1khz功率损耗的实验装置","authors":"Michal Ulvr","doi":"10.2478/msr-2023-0035","DOIUrl":null,"url":null,"abstract":"This paper describes an experimental setup used at the Czech Metrology Institute (CMI) to measure the specific power loss of oriented and non-oriented electrical steel sheets up to 1 kHz using an Epstein frame. Special attention is given to a) a description of the hardware that is used, b) a description of the feedback control and measurement software, and c) an analysis of the sources of uncertainty and validation. Calibration expanded uncertainty of (0.5 up to 1.6)% for k = 2 can be achieved with this setup.","PeriodicalId":49848,"journal":{"name":"Measurement Science Review","volume":"51 1","pages":""},"PeriodicalIF":1.0000,"publicationDate":"2023-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An Experimental Setup for Power Loss Measurement up to 1 kHz using an Epstein Frame at CMI\",\"authors\":\"Michal Ulvr\",\"doi\":\"10.2478/msr-2023-0035\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes an experimental setup used at the Czech Metrology Institute (CMI) to measure the specific power loss of oriented and non-oriented electrical steel sheets up to 1 kHz using an Epstein frame. Special attention is given to a) a description of the hardware that is used, b) a description of the feedback control and measurement software, and c) an analysis of the sources of uncertainty and validation. Calibration expanded uncertainty of (0.5 up to 1.6)% for k = 2 can be achieved with this setup.\",\"PeriodicalId\":49848,\"journal\":{\"name\":\"Measurement Science Review\",\"volume\":\"51 1\",\"pages\":\"\"},\"PeriodicalIF\":1.0000,\"publicationDate\":\"2023-11-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Measurement Science Review\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.2478/msr-2023-0035\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"INSTRUMENTS & INSTRUMENTATION\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Measurement Science Review","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.2478/msr-2023-0035","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
An Experimental Setup for Power Loss Measurement up to 1 kHz using an Epstein Frame at CMI
This paper describes an experimental setup used at the Czech Metrology Institute (CMI) to measure the specific power loss of oriented and non-oriented electrical steel sheets up to 1 kHz using an Epstein frame. Special attention is given to a) a description of the hardware that is used, b) a description of the feedback control and measurement software, and c) an analysis of the sources of uncertainty and validation. Calibration expanded uncertainty of (0.5 up to 1.6)% for k = 2 can be achieved with this setup.
期刊介绍:
- theory of measurement - mathematical processing of measured data - measurement uncertainty minimisation - statistical methods in data evaluation and modelling - measurement as an interdisciplinary activity - measurement science in education - medical imaging methods, image processing - biosignal measurement, processing and analysis - model based biomeasurements - neural networks in biomeasurement - telemeasurement in biomedicine - measurement in nanomedicine - measurement of basic physical quantities - magnetic and electric fields measurements - measurement of geometrical and mechanical quantities - optical measuring methods - electromagnetic compatibility - measurement in material science