光子计数技术在气体绝缘开关设备环氧绝缘拉杆微缺陷检测中的应用前景

IF 4.4 2区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
High Voltage Pub Date : 2023-11-20 DOI:10.1049/hve2.12388
Xianhao Fan, Shu Niu, Hanhua Luo, Jizhong Liang, Fang Liu, Wenqiang Li, Weidong Liu, Wensheng Gao, Yulong Huang, Chuanyang Li, Jinliang He
{"title":"光子计数技术在气体绝缘开关设备环氧绝缘拉杆微缺陷检测中的应用前景","authors":"Xianhao Fan,&nbsp;Shu Niu,&nbsp;Hanhua Luo,&nbsp;Jizhong Liang,&nbsp;Fang Liu,&nbsp;Wenqiang Li,&nbsp;Weidong Liu,&nbsp;Wensheng Gao,&nbsp;Yulong Huang,&nbsp;Chuanyang Li,&nbsp;Jinliang He","doi":"10.1049/hve2.12388","DOIUrl":null,"url":null,"abstract":"<p>The micro-defects in epoxy-based insulation materials generate a local high electric field which results in continuous degradation, seriously endangering the insulation system of gas-insulated switchgears. A highly sensitive detection technique is reported for micro-defects of insulation pull rods based on the photon counting (PC) technique. The results demonstrated that for an epoxy-based insulation pull rod, the photons released during electroluminescence and ionisation at 2 kV, which is less than the partial discharge inception voltage, can be clearly detected. The findings presented a strong correlation between photon counts and defect severity. Discourse has been conducted to elucidate the mechanism behind defect-induced PC, employing the amplification of ionising luminescence through electric field distortion induced by micro defects and the augmentation of electroluminescence through the aggregation of trap charge. In this regard, the authors verified that PC can serve as a potential tool in the detection of micro-insulation defects, which also has huge potential in online insulation condition monitoring.</p>","PeriodicalId":48649,"journal":{"name":"High Voltage","volume":"9 2","pages":"267-274"},"PeriodicalIF":4.4000,"publicationDate":"2023-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/hve2.12388","citationCount":"0","resultStr":"{\"title\":\"Photon counting technique as a potential tool in micro-defect detection of epoxy insulation pull rod in gas-insulated switchgears\",\"authors\":\"Xianhao Fan,&nbsp;Shu Niu,&nbsp;Hanhua Luo,&nbsp;Jizhong Liang,&nbsp;Fang Liu,&nbsp;Wenqiang Li,&nbsp;Weidong Liu,&nbsp;Wensheng Gao,&nbsp;Yulong Huang,&nbsp;Chuanyang Li,&nbsp;Jinliang He\",\"doi\":\"10.1049/hve2.12388\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>The micro-defects in epoxy-based insulation materials generate a local high electric field which results in continuous degradation, seriously endangering the insulation system of gas-insulated switchgears. A highly sensitive detection technique is reported for micro-defects of insulation pull rods based on the photon counting (PC) technique. The results demonstrated that for an epoxy-based insulation pull rod, the photons released during electroluminescence and ionisation at 2 kV, which is less than the partial discharge inception voltage, can be clearly detected. The findings presented a strong correlation between photon counts and defect severity. Discourse has been conducted to elucidate the mechanism behind defect-induced PC, employing the amplification of ionising luminescence through electric field distortion induced by micro defects and the augmentation of electroluminescence through the aggregation of trap charge. In this regard, the authors verified that PC can serve as a potential tool in the detection of micro-insulation defects, which also has huge potential in online insulation condition monitoring.</p>\",\"PeriodicalId\":48649,\"journal\":{\"name\":\"High Voltage\",\"volume\":\"9 2\",\"pages\":\"267-274\"},\"PeriodicalIF\":4.4000,\"publicationDate\":\"2023-11-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://onlinelibrary.wiley.com/doi/epdf/10.1049/hve2.12388\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"High Voltage\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1049/hve2.12388\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"High Voltage","FirstCategoryId":"5","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1049/hve2.12388","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

环氧基绝缘材料的微缺陷会产生局部高电场,导致其不断退化,严重危及气体绝缘开关设备的绝缘系统。报道了一种基于光子计数技术的绝缘拉杆微缺陷高灵敏度检测技术。结果表明,对于环氧基绝缘拉杆,在小于局部放电起始电压的2 kV电致发光和电离过程中释放的光子可以被清晰地检测到。研究结果显示光子计数和缺陷严重程度之间存在很强的相关性。本文利用微缺陷引起的电场畸变放大电离发光和陷阱电荷聚集增强电致发光的原理,阐述了缺陷诱导PC的机制。在这方面,笔者验证了PC可以作为一种潜在的检测微绝缘缺陷的工具,在绝缘状态在线监测方面也具有巨大的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Photon counting technique as a potential tool in micro-defect detection of epoxy insulation pull rod in gas-insulated switchgears

Photon counting technique as a potential tool in micro-defect detection of epoxy insulation pull rod in gas-insulated switchgears

The micro-defects in epoxy-based insulation materials generate a local high electric field which results in continuous degradation, seriously endangering the insulation system of gas-insulated switchgears. A highly sensitive detection technique is reported for micro-defects of insulation pull rods based on the photon counting (PC) technique. The results demonstrated that for an epoxy-based insulation pull rod, the photons released during electroluminescence and ionisation at 2 kV, which is less than the partial discharge inception voltage, can be clearly detected. The findings presented a strong correlation between photon counts and defect severity. Discourse has been conducted to elucidate the mechanism behind defect-induced PC, employing the amplification of ionising luminescence through electric field distortion induced by micro defects and the augmentation of electroluminescence through the aggregation of trap charge. In this regard, the authors verified that PC can serve as a potential tool in the detection of micro-insulation defects, which also has huge potential in online insulation condition monitoring.

求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
High Voltage
High Voltage Energy-Energy Engineering and Power Technology
CiteScore
9.60
自引率
27.30%
发文量
97
审稿时长
21 weeks
期刊介绍: High Voltage aims to attract original research papers and review articles. The scope covers high-voltage power engineering and high voltage applications, including experimental, computational (including simulation and modelling) and theoretical studies, which include: Electrical Insulation ● Outdoor, indoor, solid, liquid and gas insulation ● Transient voltages and overvoltage protection ● Nano-dielectrics and new insulation materials ● Condition monitoring and maintenance Discharge and plasmas, pulsed power ● Electrical discharge, plasma generation and applications ● Interactions of plasma with surfaces ● Pulsed power science and technology High-field effects ● Computation, measurements of Intensive Electromagnetic Field ● Electromagnetic compatibility ● Biomedical effects ● Environmental effects and protection High Voltage Engineering ● Design problems, testing and measuring techniques ● Equipment development and asset management ● Smart Grid, live line working ● AC/DC power electronics ● UHV power transmission Special Issues. Call for papers: Interface Charging Phenomena for Dielectric Materials - https://digital-library.theiet.org/files/HVE_CFP_ICP.pdf Emerging Materials For High Voltage Applications - https://digital-library.theiet.org/files/HVE_CFP_EMHVA.pdf
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信