Alexander Maggiacomo, Rabindra Pahari, Torsten Schaefer, Gregory Billus, Suresh Shekar, Satish Kodali, Felix Beaudoin, Aaron Sinnott
{"title":"逻辑到物理SRAM位图验证与故障定位","authors":"Alexander Maggiacomo, Rabindra Pahari, Torsten Schaefer, Gregory Billus, Suresh Shekar, Satish Kodali, Felix Beaudoin, Aaron Sinnott","doi":"10.31399/asm.cp.istfa2023p0160","DOIUrl":null,"url":null,"abstract":"Abstract Physical Failure Analysis (PFA) is essential for SRAM yield learning, especially in new technologies or FAB transfers. For this to be successful, physical coordinates for tested bitcell failures must be accurately calculated and verified. The timeline for this process can vary dramatically based on the extent and complexity of any issues. This paper details the successful use of fault localization on isolated, voltage sensitive failures to achieve confidence in verification of physical location prior to PFA.","PeriodicalId":20443,"journal":{"name":"Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Logical to Physical SRAM Bitmap Verification with Fault Localization\",\"authors\":\"Alexander Maggiacomo, Rabindra Pahari, Torsten Schaefer, Gregory Billus, Suresh Shekar, Satish Kodali, Felix Beaudoin, Aaron Sinnott\",\"doi\":\"10.31399/asm.cp.istfa2023p0160\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract Physical Failure Analysis (PFA) is essential for SRAM yield learning, especially in new technologies or FAB transfers. For this to be successful, physical coordinates for tested bitcell failures must be accurately calculated and verified. The timeline for this process can vary dramatically based on the extent and complexity of any issues. This paper details the successful use of fault localization on isolated, voltage sensitive failures to achieve confidence in verification of physical location prior to PFA.\",\"PeriodicalId\":20443,\"journal\":{\"name\":\"Proceedings\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-11-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.31399/asm.cp.istfa2023p0160\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.cp.istfa2023p0160","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Logical to Physical SRAM Bitmap Verification with Fault Localization
Abstract Physical Failure Analysis (PFA) is essential for SRAM yield learning, especially in new technologies or FAB transfers. For this to be successful, physical coordinates for tested bitcell failures must be accurately calculated and verified. The timeline for this process can vary dramatically based on the extent and complexity of any issues. This paper details the successful use of fault localization on isolated, voltage sensitive failures to achieve confidence in verification of physical location prior to PFA.
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