用于逻辑单元操作测试的纳米探测

Branden Long, Yang Su, Yunfei Wang, Christopher Morgan, Md Faisal Kabir, Ramya Padmanaban, Weston Hearne, Tad Daniel
{"title":"用于逻辑单元操作测试的纳米探测","authors":"Branden Long, Yang Su, Yunfei Wang, Christopher Morgan, Md Faisal Kabir, Ramya Padmanaban, Weston Hearne, Tad Daniel","doi":"10.31399/asm.cp.istfa2023p0420","DOIUrl":null,"url":null,"abstract":"Abstract We have identified a method for nanoprobing CMOS circuits at MHz frequencies using the same hardware already used for single transistor pulsing applications. In this paper we show example responses and failure isolation examples for both sequential and combinational logic cells and discuss the test setup and sample prep that were used to successfully collect the responses.","PeriodicalId":20443,"journal":{"name":"Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Nanoprobing for Logical Cell Operational Tests\",\"authors\":\"Branden Long, Yang Su, Yunfei Wang, Christopher Morgan, Md Faisal Kabir, Ramya Padmanaban, Weston Hearne, Tad Daniel\",\"doi\":\"10.31399/asm.cp.istfa2023p0420\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract We have identified a method for nanoprobing CMOS circuits at MHz frequencies using the same hardware already used for single transistor pulsing applications. In this paper we show example responses and failure isolation examples for both sequential and combinational logic cells and discuss the test setup and sample prep that were used to successfully collect the responses.\",\"PeriodicalId\":20443,\"journal\":{\"name\":\"Proceedings\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-11-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.31399/asm.cp.istfa2023p0420\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.cp.istfa2023p0420","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

我们已经确定了一种在MHz频率下使用与单晶体管脉冲应用相同的硬件进行纳米探测CMOS电路的方法。在本文中,我们展示了顺序和组合逻辑单元的示例响应和故障隔离示例,并讨论了用于成功收集响应的测试设置和样品准备。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Nanoprobing for Logical Cell Operational Tests
Abstract We have identified a method for nanoprobing CMOS circuits at MHz frequencies using the same hardware already used for single transistor pulsing applications. In this paper we show example responses and failure isolation examples for both sequential and combinational logic cells and discuss the test setup and sample prep that were used to successfully collect the responses.
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