Marc van Veenhuizen, Jinbo Wan, Shuhan Yang, Lei Peters-Wu
{"title":"使用LIT进行开放定位","authors":"Marc van Veenhuizen, Jinbo Wan, Shuhan Yang, Lei Peters-Wu","doi":"10.31399/asm.cp.istfa2023p0238","DOIUrl":null,"url":null,"abstract":"Abstract This paper discusses a method to observe open traces with the LIT. An overview is given of FA techniques capable of localizing high Ohmic fails. It is discussed how a wire can be made observable with LIT by injecting an AM modulated RF carrier signal. The electrical stimulus is described that excites the device and triggers the LIT. Results that demonstrate the capability of the technique are presented for several devices and the findings are evaluated.","PeriodicalId":20443,"journal":{"name":"Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Open Localization with LIT\",\"authors\":\"Marc van Veenhuizen, Jinbo Wan, Shuhan Yang, Lei Peters-Wu\",\"doi\":\"10.31399/asm.cp.istfa2023p0238\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract This paper discusses a method to observe open traces with the LIT. An overview is given of FA techniques capable of localizing high Ohmic fails. It is discussed how a wire can be made observable with LIT by injecting an AM modulated RF carrier signal. The electrical stimulus is described that excites the device and triggers the LIT. Results that demonstrate the capability of the technique are presented for several devices and the findings are evaluated.\",\"PeriodicalId\":20443,\"journal\":{\"name\":\"Proceedings\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-11-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.31399/asm.cp.istfa2023p0238\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.cp.istfa2023p0238","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Abstract This paper discusses a method to observe open traces with the LIT. An overview is given of FA techniques capable of localizing high Ohmic fails. It is discussed how a wire can be made observable with LIT by injecting an AM modulated RF carrier signal. The electrical stimulus is described that excites the device and triggers the LIT. Results that demonstrate the capability of the technique are presented for several devices and the findings are evaluated.
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