{"title":"使用延迟时间调制方法的时间分辨力显微镜","authors":"Hiroyuki Mogi, Rin Wakabayashi, Shoji YOSHIDA, Yusuke Arashida, Atsushi Taninaka, Katsuya Iwaya, Takeshi Miura, Osamu Takeuchi, Hidemi SHIGEKAWA","doi":"10.35848/1882-0786/ad0c04","DOIUrl":null,"url":null,"abstract":"Abstract We developed a time-resolved force microscopy technique by integrating the Atomic Force Microscope tuning fork-type cantilever with the delay time modulation method of optical pump-probe light. During the irradiation of the probe light, the instantaneous formation of dipoles induces a force between the probe and the sample, enabling the stable acquisition of a time-resolved force signal with a high signal-to-noise (SN) ratio. We successfully measured the dynamics of surface recombination and diffusion of photoexcited carriers in a bulk WSe2, which are challenging due to the effect of tunneling current in the time-resolved Scanning Tunneling Microscopy.","PeriodicalId":8093,"journal":{"name":"Applied Physics Express","volume":"58 18","pages":"0"},"PeriodicalIF":2.3000,"publicationDate":"2023-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Time-resolved force microscopy using delay-time modulation method\",\"authors\":\"Hiroyuki Mogi, Rin Wakabayashi, Shoji YOSHIDA, Yusuke Arashida, Atsushi Taninaka, Katsuya Iwaya, Takeshi Miura, Osamu Takeuchi, Hidemi SHIGEKAWA\",\"doi\":\"10.35848/1882-0786/ad0c04\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract We developed a time-resolved force microscopy technique by integrating the Atomic Force Microscope tuning fork-type cantilever with the delay time modulation method of optical pump-probe light. During the irradiation of the probe light, the instantaneous formation of dipoles induces a force between the probe and the sample, enabling the stable acquisition of a time-resolved force signal with a high signal-to-noise (SN) ratio. We successfully measured the dynamics of surface recombination and diffusion of photoexcited carriers in a bulk WSe2, which are challenging due to the effect of tunneling current in the time-resolved Scanning Tunneling Microscopy.\",\"PeriodicalId\":8093,\"journal\":{\"name\":\"Applied Physics Express\",\"volume\":\"58 18\",\"pages\":\"0\"},\"PeriodicalIF\":2.3000,\"publicationDate\":\"2023-11-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Applied Physics Express\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.35848/1882-0786/ad0c04\",\"RegionNum\":4,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"PHYSICS, APPLIED\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Physics Express","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.35848/1882-0786/ad0c04","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
Time-resolved force microscopy using delay-time modulation method
Abstract We developed a time-resolved force microscopy technique by integrating the Atomic Force Microscope tuning fork-type cantilever with the delay time modulation method of optical pump-probe light. During the irradiation of the probe light, the instantaneous formation of dipoles induces a force between the probe and the sample, enabling the stable acquisition of a time-resolved force signal with a high signal-to-noise (SN) ratio. We successfully measured the dynamics of surface recombination and diffusion of photoexcited carriers in a bulk WSe2, which are challenging due to the effect of tunneling current in the time-resolved Scanning Tunneling Microscopy.
期刊介绍:
Applied Physics Express (APEX) is a letters journal devoted solely to rapid dissemination of up-to-date and concise reports on new findings in applied physics. The motto of APEX is high scientific quality and prompt publication. APEX is a sister journal of the Japanese Journal of Applied Physics (JJAP) and is published by IOP Publishing Ltd on behalf of the Japan Society of Applied Physics (JSAP).