Jielei Ni, Qianyi Wei, Yuquan Zhang, Jie Xu, Xi Xie, Yixuan Chen, Yanan Fu, Gengwei Cao, Xiaocong Yuan, Changjun Min
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Super-resolution three-dimensional structured illumination profilometry for in situ measurement of femtosecond laser ablation morphology
Femtosecond laser ablation has found wide-ranging applications in the surface structuring of nanoelectronics and nanophotonics devices. Traditionally, the inspection of the fabricated three-dimensional (3D) morphology was performed using a scanning electron microscope or atomic force microscopy in an ex situ manner after processing was complete. To quickly monitor and efficiently optimize the quality of surface fabrication, we developed an in situ method to accurately reconstruct the 3D morphology of surface micro-structures. This method is based on a triangulation optical system that utilizes structured illumination. The approach offers a super-resolution capacity, making it a powerful and non-invasive tool for quick in situ monitoring of surface ablation structures.
APL PhotonicsPhysics and Astronomy-Atomic and Molecular Physics, and Optics
CiteScore
10.30
自引率
3.60%
发文量
107
审稿时长
19 weeks
期刊介绍:
APL Photonics is the new dedicated home for open access multidisciplinary research from and for the photonics community. The journal publishes fundamental and applied results that significantly advance the knowledge in photonics across physics, chemistry, biology and materials science.