Yuan Zhao, Bruno Tolla, Doug Katze, Glenda Castaneda, Jo-Anne Wilson, David Brand
{"title":"用于高功率密度电子器件的混合无压银烧结技术","authors":"Yuan Zhao, Bruno Tolla, Doug Katze, Glenda Castaneda, Jo-Anne Wilson, David Brand","doi":"10.4071/001c.88422","DOIUrl":null,"url":null,"abstract":"Aerospace and defense applications present unique challenges for material suppliers. As increasing adoption of advanced semiconductor materials and Diverse Accessible Heterogeneous Integration technologies, power density of defense and aerospace devices increases rapidly. Traditional die-attaching technology is becoming an increasingly limiting factor in microelectronics packaging for the next generation aerospace and defense systems. Metal particle sintering creates a porous metal foam, which can significantly enhance heat transfer within the sintered material. However, the traditional silver sintering requires very high sintering temperatures that cannot be tolerated by typical microelectronics devices. In addition, the sintered metal foam contains open-cell pores that can absorb/entrap moisture and dusts, which poses a reliability risk. This article introduces an advanced hybrid silver sintering material, which incorporates highperformance silver sintering with high reliability and process-friendly of epoxy-based die-attaching technology. This hybrid sintering paste can be processed without applying any pressures in temperature ranges that are normal in microelectronics packaging processes. Preliminary experimental studies, including Scanning Electron Microscopic study, volume resistivity tests, die shear strength tests, and thermal resistance tests, were performed for developing a low temperature sintering schedule that is compatible with normal assembly processes of high-power density electronics devices. The results indicated that the hybrid material could achieve silver sintering at 150 degrees C and offer 36 enhancement on thermal performance comparing with a widely used die-attach material.","PeriodicalId":35312,"journal":{"name":"Journal of Microelectronics and Electronic Packaging","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Hybrid Pressureless Silver Sintering Technology for High-Power Density Electronics\",\"authors\":\"Yuan Zhao, Bruno Tolla, Doug Katze, Glenda Castaneda, Jo-Anne Wilson, David Brand\",\"doi\":\"10.4071/001c.88422\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Aerospace and defense applications present unique challenges for material suppliers. As increasing adoption of advanced semiconductor materials and Diverse Accessible Heterogeneous Integration technologies, power density of defense and aerospace devices increases rapidly. Traditional die-attaching technology is becoming an increasingly limiting factor in microelectronics packaging for the next generation aerospace and defense systems. Metal particle sintering creates a porous metal foam, which can significantly enhance heat transfer within the sintered material. However, the traditional silver sintering requires very high sintering temperatures that cannot be tolerated by typical microelectronics devices. In addition, the sintered metal foam contains open-cell pores that can absorb/entrap moisture and dusts, which poses a reliability risk. This article introduces an advanced hybrid silver sintering material, which incorporates highperformance silver sintering with high reliability and process-friendly of epoxy-based die-attaching technology. This hybrid sintering paste can be processed without applying any pressures in temperature ranges that are normal in microelectronics packaging processes. Preliminary experimental studies, including Scanning Electron Microscopic study, volume resistivity tests, die shear strength tests, and thermal resistance tests, were performed for developing a low temperature sintering schedule that is compatible with normal assembly processes of high-power density electronics devices. The results indicated that the hybrid material could achieve silver sintering at 150 degrees C and offer 36 enhancement on thermal performance comparing with a widely used die-attach material.\",\"PeriodicalId\":35312,\"journal\":{\"name\":\"Journal of Microelectronics and Electronic Packaging\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Microelectronics and Electronic Packaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.4071/001c.88422\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Microelectronics and Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.4071/001c.88422","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}
A Hybrid Pressureless Silver Sintering Technology for High-Power Density Electronics
Aerospace and defense applications present unique challenges for material suppliers. As increasing adoption of advanced semiconductor materials and Diverse Accessible Heterogeneous Integration technologies, power density of defense and aerospace devices increases rapidly. Traditional die-attaching technology is becoming an increasingly limiting factor in microelectronics packaging for the next generation aerospace and defense systems. Metal particle sintering creates a porous metal foam, which can significantly enhance heat transfer within the sintered material. However, the traditional silver sintering requires very high sintering temperatures that cannot be tolerated by typical microelectronics devices. In addition, the sintered metal foam contains open-cell pores that can absorb/entrap moisture and dusts, which poses a reliability risk. This article introduces an advanced hybrid silver sintering material, which incorporates highperformance silver sintering with high reliability and process-friendly of epoxy-based die-attaching technology. This hybrid sintering paste can be processed without applying any pressures in temperature ranges that are normal in microelectronics packaging processes. Preliminary experimental studies, including Scanning Electron Microscopic study, volume resistivity tests, die shear strength tests, and thermal resistance tests, were performed for developing a low temperature sintering schedule that is compatible with normal assembly processes of high-power density electronics devices. The results indicated that the hybrid material could achieve silver sintering at 150 degrees C and offer 36 enhancement on thermal performance comparing with a widely used die-attach material.
期刊介绍:
The International Microelectronics And Packaging Society (IMAPS) is the largest society dedicated to the advancement and growth of microelectronics and electronics packaging technologies through professional education. The Society’s portfolio of technologies is disseminated through symposia, conferences, workshops, professional development courses and other efforts. IMAPS currently has more than 4,000 members in the United States and more than 4,000 international members around the world.