钇稳定氧化锆的微波复合誘電率

Anna Case;Aaron Barvincak;Reza Zoughi
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引用次数: 0

摘要

使用圆波导探针测量了粉末和烧结(即固体)形态的 8 摩尔钇稳定氧化锆(8-YSZ)的复介电常数,频率范围为 32 至 40 千兆赫。这种探头适用于测量粉末和固体形式的材料。在三个频段对粉末进行了完全填充矩形波导比较测量,以验证这些结果,并扩大测量的复介电常数估计频率范围。结果表明,两种不同测量技术之间的一致性很好。测得 8-YSZ 粉末的复介电常数为 $(\epsilon _{r} = 2.45 - j0.04)$ 。还使用圆波导探针测量了导体衬底固体 8-YSZ,它代表了一种在役陶瓷涂层。当 8-YSZ 烧结成固体形式时,测量到的复介电常数明显更高(\epsilon _{r} = 29.28 - j0.07)。这归因于烧结过程中发生的致密化和其他效应。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Microwave Complex Permittivity of Yttria-Stabilized Zirconia
The complex permittivity of 8-mol yttria-stabilized zirconia (8-YSZ) in powder and sintered (i.e., solid) forms were measured from 32 to 40 GHz using a circular waveguide probe. This probe is suitable for measuring both the powder and solid forms of materials. Comparative completely filled rectangular waveguide measurements of the powder were performed at three frequency bands to verify these results and also to extend the measured complex permittivity estimation frequency range. The results indicated good agreement between the two different measurement techniques. The complex permittivity of the 8-YSZ powder was measured to be $(\epsilon _{r} = 2.45 - j0.04)$ . Conductor-backed solid 8-YSZ, representative of an in-service ceramic coating, was also measured using the circular waveguide probe. Complex permittivity was measured to be significantly higher $(\epsilon _{r} = 29.28 - j0.07)$ when the 8-YSZ was sintered into a solid form. This was attributed to densification and other effects occurring during the sintering process.
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