基于Pt/HTCC氧化铝的电子封装系统和高温恶劣环境应用集成工艺

Liang-Yu Chen, Philip G. Neudeck, David J. Spry, Gary W. Hunter
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摘要

长期的金星表面任务需要能够在500°C下运行的电子设备,以及下一代航空发动机的现场监测和控制。高温传感器和电子设备也可以在军事、能源和汽车工业中找到许多应用。各种碳化硅(SiC)传感器和电子设备已经开发出在500°C下运行,并且需要一个兼容的封装系统来长期测试和部署这些高温设备。提出了高温共烧陶瓷(HTCC)氧化铝与铂(Pt)导体用于高温电子封装。一个原型Pt/HTCC氧化铝封装系统,包括芯片级封装和电路板,已经简要报道了在500°C下对SiC集成电路进行长期电气测试,以及在更高温度下进行简短测试。HTCC氧化铝是一种优良的介电材料,在较宽的温度和频率范围内具有可接受的介电常数和低介电损耗。铂在化学上是高贵的,可以与HTCC氧化铝在空气环境中共烧,产生一种可行的高温应用电子封装材料系统。本文对该封装系统进行了更详细的描述,包括原型低功耗封装和基于HTCC氧化铝和Pt金属化的电路板,适用于500°C和其他恶劣环境应用。介绍了芯片级封装和电路板组装的关键技术考虑因素,包括500°C耐用线键合和SiC芯片连接的材料和工艺,以及多芯片电路板的集成。讨论了该封装方法在500℃和700℃下应用于SiC集成电路的实验测试结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Pt/HTCC Alumina based Electronic Packaging System and Integration Processes for High Temperature Harsh Environment Applications
Electronic devices capable of operation at 500°C are required for long term Venus surface missions, as well as for in situ monitoring and control of next generation aeronautical engines. High temperature sensors and electronics can also find many applications in military, and energy and automobile industries. Various silicon carbide (SiC) sensors and electronic devices have been developed for operation at 500 °C, and a compatible packaging system is needed for long term test and deployment of these high temperature devices. High temperature co-fired ceramics (HTCC) alumina with platinum (Pt) conductor was proposed for high temperature electronic packaging. A prototype Pt/HTCC alumina packaging system including chip-level package and circuit board has been briefly reported previously for long-term electrical testing of SiC integrated circuits at 500 °C, and brief testing at much higher temperatures. HTCC alumina is an excellent dielectric material with acceptable dielectric constant and low dielectric loss over wide temperature and frequency ranges. Pt is chemically noble and can be co-fired with HTCC alumina in air ambient producing a viable electronic packaging material system for high temperature applications. This paper presents a more detailed description of this packaging system including prototype low power packages and circuit boards based on HTCC alumina and Pt metallization for 500°C and other harsh environment applications. The key technical considerations for chip-level packaging and circuit board assembly, including materials and processes for 500 °C durable wire-bonding and SiC die attach, and integration of multi-chip circuit boards, are presented. Experimental test results of this packaging approach applied to SiC integrated circuits at 500 °C and 700°C are discussed as well.
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