在TEM图像和电子断层图中，样品厚度影响对比度和测量形状

IF 2.5 3区工程技术 Q1 MICROSCOPY

Micron Pub Date : 2023-11-07 DOI:10.1016/j.micron.2023.103562

Misa Hayashida , Jun Yamasaki , Marek Malac

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引用次数: 0

摘要

在透射电子显微镜(TEM)下，研究了纳米颗粒(NP)图像展宽及其对比度变化对支撑基质厚度的影响。我们测量了NP大小和原子序数对其图像展宽的影响。基于实验TEM图像，我们在四种支持矩阵上生成了NPs的层析图。这种层析图中NPs的测量形状长宽比取决于支撑矩阵的几何形状。例如，放置在具有窗框支撑的薄膜上的6纳米NP的纵横比为1.14，而放置在直径为910纳米的棒状支撑上的6纳米NP的纵横比在层析图中为1.67。

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Sample thickness affects contrast and measured shape in TEM images and in electron tomograms

We investigated the effect of nanoparticle (NP) image broadening and its contrast change dependence on a support matrix thickness in a transmission electron microscope (TEM). We measured the effect of NP size and atomic number on its image broadening. Based on the experimental TEM images we generated tomograms of NPs on four types of support matrix. The measured shape aspect ratio of the NPs in such tomograms depends on the geometry of the support matrix. For example, the aspect ratio of 6 nm NP placed on a thin film with window-frame support is 1.14, while the aspect ratio of 6 nm NP on a rod-shaped support with 910 nm diameter is 1.67 in a tomogram.

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来源期刊

Micron 工程技术-显微镜技术

CiteScore

4.30

自引率

4.20%

发文量

100

审稿时长

31 days

期刊介绍： Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.