具有机械可靠薄膜封装的生物电子植入物的寿命工程

IF 5 Q1 ENGINEERING, BIOMEDICAL
Martin Niemiec, Kyungjin Kim
{"title":"具有机械可靠薄膜封装的生物电子植入物的寿命工程","authors":"Martin Niemiec, Kyungjin Kim","doi":"10.1088/2516-1091/ad0b19","DOIUrl":null,"url":null,"abstract":"Abstract While the importance of thin form factor and mechanical tissue biocompatibility has been made clear for next generation bioelectronic implants, material systems meeting these criteria still have not demonstrated sufficient long-term durability. This review provides an update on the materials used in modern bioelectronic implants as substrates and protective encapsulations, with a particular focus on flexible and conformable devices. We review how thin film encapsulations are known to fail due to mechanical stresses and environmental surroundings under processing and operating conditions. This information is then reflected in recommending state-of-the-art encapsulation strategies for designing mechanically reliable thin film bioelectronic interfaces. Finally, we assess the methods used to evaluate novel bioelectronic implant devices and the current state of their longevity based on encapsulation and substrate materials. We also provide insights for future testing to engineer long-lived bioelectronic implants more effectively and to make implantable bioelectronics a viable option for chronic diseases in accordance with each patient’s therapeutical timescale.","PeriodicalId":74582,"journal":{"name":"Progress in biomedical engineering (Bristol, England)","volume":null,"pages":null},"PeriodicalIF":5.0000,"publicationDate":"2023-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Lifetime engineering of bioelectronic implants with mechanically reliable thin film encapsulations\",\"authors\":\"Martin Niemiec, Kyungjin Kim\",\"doi\":\"10.1088/2516-1091/ad0b19\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract While the importance of thin form factor and mechanical tissue biocompatibility has been made clear for next generation bioelectronic implants, material systems meeting these criteria still have not demonstrated sufficient long-term durability. This review provides an update on the materials used in modern bioelectronic implants as substrates and protective encapsulations, with a particular focus on flexible and conformable devices. We review how thin film encapsulations are known to fail due to mechanical stresses and environmental surroundings under processing and operating conditions. This information is then reflected in recommending state-of-the-art encapsulation strategies for designing mechanically reliable thin film bioelectronic interfaces. Finally, we assess the methods used to evaluate novel bioelectronic implant devices and the current state of their longevity based on encapsulation and substrate materials. We also provide insights for future testing to engineer long-lived bioelectronic implants more effectively and to make implantable bioelectronics a viable option for chronic diseases in accordance with each patient’s therapeutical timescale.\",\"PeriodicalId\":74582,\"journal\":{\"name\":\"Progress in biomedical engineering (Bristol, England)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":5.0000,\"publicationDate\":\"2023-11-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Progress in biomedical engineering (Bristol, England)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1088/2516-1091/ad0b19\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, BIOMEDICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Progress in biomedical engineering (Bristol, England)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/2516-1091/ad0b19","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, BIOMEDICAL","Score":null,"Total":0}
引用次数: 0

摘要

虽然薄的外形因素和机械组织生物相容性对于下一代生物电子植入物的重要性已经明确,但满足这些标准的材料系统仍然没有证明足够的长期耐用性。本综述提供了现代生物电子植入物中用作基板和保护封装的材料的最新情况,特别关注柔性和可适应的设备。我们回顾了在加工和操作条件下,薄膜封装是如何由于机械应力和环境环境而失效的。这些信息随后反映在推荐最先进的封装策略中,用于设计机械可靠的薄膜生物电子界面。最后,我们评估了用于评估新型生物电子植入装置的方法以及基于封装和衬底材料的寿命现状。我们还为未来的测试提供了见解,以更有效地设计长寿命的生物电子植入物,并根据每个患者的治疗时间表使植入式生物电子成为慢性病的可行选择。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Lifetime engineering of bioelectronic implants with mechanically reliable thin film encapsulations
Abstract While the importance of thin form factor and mechanical tissue biocompatibility has been made clear for next generation bioelectronic implants, material systems meeting these criteria still have not demonstrated sufficient long-term durability. This review provides an update on the materials used in modern bioelectronic implants as substrates and protective encapsulations, with a particular focus on flexible and conformable devices. We review how thin film encapsulations are known to fail due to mechanical stresses and environmental surroundings under processing and operating conditions. This information is then reflected in recommending state-of-the-art encapsulation strategies for designing mechanically reliable thin film bioelectronic interfaces. Finally, we assess the methods used to evaluate novel bioelectronic implant devices and the current state of their longevity based on encapsulation and substrate materials. We also provide insights for future testing to engineer long-lived bioelectronic implants more effectively and to make implantable bioelectronics a viable option for chronic diseases in accordance with each patient’s therapeutical timescale.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
CiteScore
9.40
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信