基于超表面的折射率罗经浓度监测

IF 2.3 4区物理与天体物理 Q3 PHYSICS, APPLIED

Applied Physics Express Pub Date : 2023-11-14 DOI:10.35848/1882-0786/ad0c79

Wenjie Sun, Yikai Chen, Xilong Liu, Junfeng Li, Zekai Wang, Shijun Zhu, Zhonghua Shen

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引用次数: 0

摘要

摘要设计了一种基于超薄旋转金属纳米柱的直显式折射率检测芯片。当环境波动时，它可以根据设计将检测信号聚焦到不同的方向。该折射率罗盘结构紧凑，可方便地安装在传统的便携式设备上，工作范围可调。利用单个超表面包含的多组相位信息，通过观察双波长共入射下焦点的位置和颜色，可以准确地确定表面或溶液浓度上的环境折射率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Concentration monitoring through a refractive index compass based on metasurface

Abstract We have designed a directly-displayed refractive index detection chip based on an ultra-thin rotating metal nanopillars. When environments fluctuate, it can focus the detection signal on different directions as designed. This refractive index compass can be easily attached to conventional portable devices due to its compact structure, and has a wide adjustable working range. By utilizing multiple sets of phase information contained in a single metasurface, the environmental refractive index on surface or solution concentration can be accurately determined by observing the position and color of the focal point under dual wavelength common incidence.

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来源期刊

Applied Physics Express 物理-物理：应用

CiteScore

4.80

自引率

8.70%

发文量

310

审稿时长

1.2 months

期刊介绍： Applied Physics Express (APEX) is a letters journal devoted solely to rapid dissemination of up-to-date and concise reports on new findings in applied physics. The motto of APEX is high scientific quality and prompt publication. APEX is a sister journal of the Japanese Journal of Applied Physics (JJAP) and is published by IOP Publishing Ltd on behalf of the Japan Society of Applied Physics (JSAP).