硅异质结技术电池用导电胶带的性能和耐久性

IF 8 2区 材料科学 Q1 ENERGY & FUELS
Peter Hacke, David C. Miller, Daniel Pierpont, Tianyu Wu
{"title":"硅异质结技术电池用导电胶带的性能和耐久性","authors":"Peter Hacke,&nbsp;David C. Miller,&nbsp;Daniel Pierpont,&nbsp;Tianyu Wu","doi":"10.1002/pip.3749","DOIUrl":null,"url":null,"abstract":"<p>Electrically conductive tape (ECT) was characterized and used to assemble shingled cell strings at low temperature to achieve high reliability Pb- and Ag-free interconnections. The volume resistivity for two considered ECTs are 0.13 ± 0.06 mΩ·cm and 0.47 ± 0.20 mΩ·cm and specific contact resistances, 6.85± 2.00 mΩ·cm<sup>2</sup> and 6.30 ± 0.37 mΩ·cm<sup>2</sup> using the emerging IEC 62788-8-1 Technical Specification for assessment of electrically conductive adhesives (ECA). Durability and performance of the technology in glass–glass mini modules were evaluated with temperature cycling, damp heat testing, and combined-accelerated stress testing (CAST). Through temperature cycling (−40°C to 85°C) applying five times the mini module short-circuit current in forward bias and in the multi climate CAST protocol, there was negligible degradation of fill factor after replacing connectors at the modules' cable leads; however, CAST resulted in short circuit current loss attributed to degradation in light collection by the cells, not the ECT. The IEC 61215-2 85°C, 85% relative humidity damp heat testing showed susceptibility of the HJT cells to effects of humidity in the electroluminescence intensity around the module perimeter that degraded power performance by 4% (relative). Contrasting the IEC 61215-2 qualification testing-based damp heat testing with CAST, factors such as the optical stress of CAST may precipitate the degradation of the modules whereas the humidity levels and duration of IEC 61215-2 damp heat testing may lead to excessive levels of humidity diffused into the modules, potentially resulting in degradation that is unrepresentative of the field.</p>","PeriodicalId":223,"journal":{"name":"Progress in Photovoltaics","volume":"33 1","pages":"16-26"},"PeriodicalIF":8.0000,"publicationDate":"2023-11-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Performance and durability of electrically conductive tape for shingled Si heterojunction technology cells\",\"authors\":\"Peter Hacke,&nbsp;David C. Miller,&nbsp;Daniel Pierpont,&nbsp;Tianyu Wu\",\"doi\":\"10.1002/pip.3749\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Electrically conductive tape (ECT) was characterized and used to assemble shingled cell strings at low temperature to achieve high reliability Pb- and Ag-free interconnections. The volume resistivity for two considered ECTs are 0.13 ± 0.06 mΩ·cm and 0.47 ± 0.20 mΩ·cm and specific contact resistances, 6.85± 2.00 mΩ·cm<sup>2</sup> and 6.30 ± 0.37 mΩ·cm<sup>2</sup> using the emerging IEC 62788-8-1 Technical Specification for assessment of electrically conductive adhesives (ECA). Durability and performance of the technology in glass–glass mini modules were evaluated with temperature cycling, damp heat testing, and combined-accelerated stress testing (CAST). Through temperature cycling (−40°C to 85°C) applying five times the mini module short-circuit current in forward bias and in the multi climate CAST protocol, there was negligible degradation of fill factor after replacing connectors at the modules' cable leads; however, CAST resulted in short circuit current loss attributed to degradation in light collection by the cells, not the ECT. The IEC 61215-2 85°C, 85% relative humidity damp heat testing showed susceptibility of the HJT cells to effects of humidity in the electroluminescence intensity around the module perimeter that degraded power performance by 4% (relative). Contrasting the IEC 61215-2 qualification testing-based damp heat testing with CAST, factors such as the optical stress of CAST may precipitate the degradation of the modules whereas the humidity levels and duration of IEC 61215-2 damp heat testing may lead to excessive levels of humidity diffused into the modules, potentially resulting in degradation that is unrepresentative of the field.</p>\",\"PeriodicalId\":223,\"journal\":{\"name\":\"Progress in Photovoltaics\",\"volume\":\"33 1\",\"pages\":\"16-26\"},\"PeriodicalIF\":8.0000,\"publicationDate\":\"2023-11-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Progress in Photovoltaics\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1002/pip.3749\",\"RegionNum\":2,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENERGY & FUELS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Progress in Photovoltaics","FirstCategoryId":"88","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/pip.3749","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENERGY & FUELS","Score":null,"Total":0}
引用次数: 0

摘要

摘要:本文对导电带(ECT)进行了表征,并将其用于在低温下组装瓦片电池串,以实现高可靠性的无铅无银互连。两个考虑的ECTs的体积电阻率为0.13±0.06 mΩ·cm和0.47±0.20 mΩ·cm,具体接触电阻为6.85±2.00 mΩ·cm 2和6.30±0.37 mΩ·cm 2,使用新兴的IEC 62788‐8‐1技术规范评估导电胶粘剂(ECA)。通过温度循环、湿热测试和联合加速应力测试(CAST)来评估该技术在玻璃-玻璃微型模块中的耐久性和性能。通过温度循环(- 40°C至85°C),在正向偏置和多气候CAST协议下施加5倍的迷你模块短路电流,在更换模块电缆导线处的连接器后,填充因子的退化可以忽略不计;然而,CAST导致的短路电流损失归因于细胞收集光的退化,而不是ECT。IEC 61215‐2 85°C, 85%相对湿度的湿热测试表明,HJT电池对模块周围电致发光强度的湿度影响的敏感性降低了4%(相对)的功率性能。将基于IEC 61215‐2资质测试的湿热测试与CAST进行对比,CAST的光学应力等因素可能会导致模块的退化,而IEC 61215‐2湿热测试的湿度水平和持续时间可能会导致过度的湿度扩散到模块中,从而可能导致不具有该领域代表性的退化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Performance and durability of electrically conductive tape for shingled Si heterojunction technology cells

Performance and durability of electrically conductive tape for shingled Si heterojunction technology cells

Electrically conductive tape (ECT) was characterized and used to assemble shingled cell strings at low temperature to achieve high reliability Pb- and Ag-free interconnections. The volume resistivity for two considered ECTs are 0.13 ± 0.06 mΩ·cm and 0.47 ± 0.20 mΩ·cm and specific contact resistances, 6.85± 2.00 mΩ·cm2 and 6.30 ± 0.37 mΩ·cm2 using the emerging IEC 62788-8-1 Technical Specification for assessment of electrically conductive adhesives (ECA). Durability and performance of the technology in glass–glass mini modules were evaluated with temperature cycling, damp heat testing, and combined-accelerated stress testing (CAST). Through temperature cycling (−40°C to 85°C) applying five times the mini module short-circuit current in forward bias and in the multi climate CAST protocol, there was negligible degradation of fill factor after replacing connectors at the modules' cable leads; however, CAST resulted in short circuit current loss attributed to degradation in light collection by the cells, not the ECT. The IEC 61215-2 85°C, 85% relative humidity damp heat testing showed susceptibility of the HJT cells to effects of humidity in the electroluminescence intensity around the module perimeter that degraded power performance by 4% (relative). Contrasting the IEC 61215-2 qualification testing-based damp heat testing with CAST, factors such as the optical stress of CAST may precipitate the degradation of the modules whereas the humidity levels and duration of IEC 61215-2 damp heat testing may lead to excessive levels of humidity diffused into the modules, potentially resulting in degradation that is unrepresentative of the field.

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来源期刊
Progress in Photovoltaics
Progress in Photovoltaics 工程技术-能源与燃料
CiteScore
18.10
自引率
7.50%
发文量
130
审稿时长
5.4 months
期刊介绍: Progress in Photovoltaics offers a prestigious forum for reporting advances in this rapidly developing technology, aiming to reach all interested professionals, researchers and energy policy-makers. The key criterion is that all papers submitted should report substantial “progress” in photovoltaics. Papers are encouraged that report substantial “progress” such as gains in independently certified solar cell efficiency, eligible for a new entry in the journal''s widely referenced Solar Cell Efficiency Tables. Examples of papers that will not be considered for publication are those that report development in materials without relation to data on cell performance, routine analysis, characterisation or modelling of cells or processing sequences, routine reports of system performance, improvements in electronic hardware design, or country programs, although invited papers may occasionally be solicited in these areas to capture accumulated “progress”.
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