Development and identification of two novel wheat-rye 6R derivative lines with adult-plant resistance to powdery mildew and high-yielding potential

Powdery mildew, caused by Blumeria graminis f. sp. tritici (Bgt), is a devastating disease that seriously threatens wheat yield and quality. To control this disease, host resistance is the most effective measure. Compared with the resistance genes from common wheat, alien resistance genes can better withstand infection of this highly variable pathogen. Development of elite alien germplasm resources with powdery mildew resistance and other key breeding traits is an attractive strategy in wheat breeding. In this study, three wheat-rye germplasm lines YT4-1, YT4-2, and YT4-3 were developed through hybridization between octoploid triticale and common wheat, out of which the lines YT4-1 and YT4-2 conferred adult-plant resistance (APR) to powdery mildew while the line YT4-3 was susceptible to powdery mildew during all of its growth stages. Using genomic in situ hybridization, multi-color fluorescence in situ hybridization, multi-color GISH, and molecular marker analysis, YT4-1, YT4-2, and YT4-3 were shown to be cytogenetically stable wheat-rye 6R addition and T1RS·1BL translocation line, 6RL ditelosomic addition and T1RS·1BL translocation line, and T1RS·1BL translocation line, respectively. Compared with previously reported wheat-rye derivative lines carrying chromosome 6R, YT4-1 and YT4-2 showed stable APR without undesirable pleiotropic effects on agronomic traits. Therefore, these novel wheat-rye 6R derivative lines are expected to be promising bridge resources in wheat disease breeding.