{"title":"半导体器件的ESD保护技术","authors":"J. Vinson, J. Liou","doi":"10.1109/ICMEL.2000.840579","DOIUrl":null,"url":null,"abstract":"Electrostatic discharges (ESD) are everywhere-in our homes, businesses and even at the manufacturers of the electronics we buy. The discharges cause failure of these electronic components. Presented here is a two pronged approach for ESD protection: reduce the likelihood of having an ESD event and improving the robustness of the devices. The first approach focuses on reducing the charge developed and controlling the redistribution of any charges that are developed. The second approach looks at ways to improve both the processes used to build electronics as well as the devices themselves.","PeriodicalId":215956,"journal":{"name":"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"ESD protection techniques for semiconductor devices\",\"authors\":\"J. Vinson, J. Liou\",\"doi\":\"10.1109/ICMEL.2000.840579\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electrostatic discharges (ESD) are everywhere-in our homes, businesses and even at the manufacturers of the electronics we buy. The discharges cause failure of these electronic components. Presented here is a two pronged approach for ESD protection: reduce the likelihood of having an ESD event and improving the robustness of the devices. The first approach focuses on reducing the charge developed and controlling the redistribution of any charges that are developed. The second approach looks at ways to improve both the processes used to build electronics as well as the devices themselves.\",\"PeriodicalId\":215956,\"journal\":{\"name\":\"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-05-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMEL.2000.840579\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMEL.2000.840579","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
ESD protection techniques for semiconductor devices
Electrostatic discharges (ESD) are everywhere-in our homes, businesses and even at the manufacturers of the electronics we buy. The discharges cause failure of these electronic components. Presented here is a two pronged approach for ESD protection: reduce the likelihood of having an ESD event and improving the robustness of the devices. The first approach focuses on reducing the charge developed and controlling the redistribution of any charges that are developed. The second approach looks at ways to improve both the processes used to build electronics as well as the devices themselves.