用18mev质子测试木星飞行时间质谱仪的厚膜电阻器的辐射硬度

D. Lasi, M. Tulej, M. Neuland, P. Wurz, T. Carzaniga, K. Nesteruk, S. Braccini, H. Elsener
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引用次数: 4

摘要

欧空局木星任务JUICE上的中性和离子质谱仪采用厚膜电阻器(从~ 1 Ω到~ 1 MQ),丝网印刷在陶瓷元件上,以实现高压离子光学元件和净化加热器。尽管有相关的空间遗产,但这些材料以前从未在与木星磁层相当的辐射环境中使用过。通过这项研究,我们证明了这些材料在真空中用18 MeV的质子照射高达16-85 Mrad的NIM仪器的适用性。为了精确计算剂量,样品的化学成分由激光质谱测定。通过定制的辐照站,在辐照过程中实时监测样品的温度和电气参数,或将样品置于代表空间操作条件的高压下。总而言之,在所调查的剂量范围内,这些材料被证明是抗辐射的,只有少数例外情况会造成永久性损害。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Testing the radiation hardness of thick-film resistors for a time-of-flight mass spectrometer at jupiter with 18 MeV protons
The Neutral and Ion Mass Spectrometer onboard ESA Jupiter mission JUICE employs thick-film resistors (from ∼1 Ω to ∼1 MQ), screen-printed on ceramic elements, to realize high-voltage ion optical elements and decontamination heaters. Despite the relevant space heritage, these materials were never employed before in a radiation environment comparable to Jupiter's magnetosphere. With this study, we prove the suitability of these materials for the NIM instrument by means of irradiation up to ∼ 16–85 Mrad in vacuum with 18 MeV protons. To allow an accurate calculation of the dose, the chemical composition of the samples is determined by Laser Mass Spectrometry. Thanks to a custom-designed irradiation station, the temperature and the electrical parameters of the sample are monitored in real-time during the irradiation, or the sample can be subject to high-voltages representative of the operating conditions in space. All in all, the materials proved to be radiation-hard in the investigated dose range, with few exceptions where permanent damages occur.
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