W. Luo, Qi Lin, Jie Huang, K. Wong, Liying Lin, K. Lau
{"title":"在(001)Si上生长的InP/GaAsP DWELL激光器,发射波长为740 nm","authors":"W. Luo, Qi Lin, Jie Huang, K. Wong, Liying Lin, K. Lau","doi":"10.23919/ISLC52947.2022.9943341","DOIUrl":null,"url":null,"abstract":"We report electrically pumped InP/GaAsP dot-in-well (DWELL) lasers grown on (001) Si. The lowest threshold current density of the DWELL laser on Si is 1.67 kA/cm2, measured on a $k$ device. The maximum operating temperature is 40 °C.","PeriodicalId":443954,"journal":{"name":"2022 28th International Semiconductor Laser Conference (ISLC)","volume":"1 9","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"InP/GaAsP DWELL lasers grown on (001) Si emitting at 740 nm\",\"authors\":\"W. Luo, Qi Lin, Jie Huang, K. Wong, Liying Lin, K. Lau\",\"doi\":\"10.23919/ISLC52947.2022.9943341\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report electrically pumped InP/GaAsP dot-in-well (DWELL) lasers grown on (001) Si. The lowest threshold current density of the DWELL laser on Si is 1.67 kA/cm2, measured on a $k$ device. The maximum operating temperature is 40 °C.\",\"PeriodicalId\":443954,\"journal\":{\"name\":\"2022 28th International Semiconductor Laser Conference (ISLC)\",\"volume\":\"1 9\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 28th International Semiconductor Laser Conference (ISLC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/ISLC52947.2022.9943341\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 28th International Semiconductor Laser Conference (ISLC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ISLC52947.2022.9943341","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
InP/GaAsP DWELL lasers grown on (001) Si emitting at 740 nm
We report electrically pumped InP/GaAsP dot-in-well (DWELL) lasers grown on (001) Si. The lowest threshold current density of the DWELL laser on Si is 1.67 kA/cm2, measured on a $k$ device. The maximum operating temperature is 40 °C.