高速PCB互连的热影响

Sunil Pathania, Mallikarjun Vasa, B. Mutnury, Rohit Sharma
{"title":"高速PCB互连的热影响","authors":"Sunil Pathania, Mallikarjun Vasa, B. Mutnury, Rohit Sharma","doi":"10.1109/EPEPS47316.2019.193226","DOIUrl":null,"url":null,"abstract":"As signal speeds increase, small imperfections start to dictate the performance of interconnects. Thermal effects are an inseparable aspect of interconnects due to self-heating caused by the flow of current, and due to environmental heating in high speed designs. This paper presents in detail, thermal effects and their impact on insertion loss, crosstalk and phase of high-speed signals. The paper also describes the thermal sensitivity on various aspects of interconnect design such as inter pair spacing, trace height, and dielectric thickness. For our analysis, simulations were performed using field solvers for temperatures ranging from 20°C to 100°C. Finally, results are analyzed with percentage variation in copper loss versus dielectric losses.","PeriodicalId":304228,"journal":{"name":"2019 IEEE 28th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","volume":"126 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Thermal Impact on High Speed PCB Interconnects\",\"authors\":\"Sunil Pathania, Mallikarjun Vasa, B. Mutnury, Rohit Sharma\",\"doi\":\"10.1109/EPEPS47316.2019.193226\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As signal speeds increase, small imperfections start to dictate the performance of interconnects. Thermal effects are an inseparable aspect of interconnects due to self-heating caused by the flow of current, and due to environmental heating in high speed designs. This paper presents in detail, thermal effects and their impact on insertion loss, crosstalk and phase of high-speed signals. The paper also describes the thermal sensitivity on various aspects of interconnect design such as inter pair spacing, trace height, and dielectric thickness. For our analysis, simulations were performed using field solvers for temperatures ranging from 20°C to 100°C. Finally, results are analyzed with percentage variation in copper loss versus dielectric losses.\",\"PeriodicalId\":304228,\"journal\":{\"name\":\"2019 IEEE 28th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"volume\":\"126 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 28th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS47316.2019.193226\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 28th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS47316.2019.193226","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

摘要

随着信号速度的增加,微小的缺陷开始决定互连的性能。在高速设计中,由于电流引起的自热和环境加热,热效应是互连不可分割的一个方面。本文详细介绍了高速信号的热效应及其对插入损耗、串扰和相位的影响。本文还介绍了热敏性在互连设计的各个方面,如间对间距、走线高度和介电厚度。在我们的分析中,使用现场求解器在20°C至100°C的温度范围内进行模拟。最后,分析了铜损耗与介电损耗的百分比变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Thermal Impact on High Speed PCB Interconnects
As signal speeds increase, small imperfections start to dictate the performance of interconnects. Thermal effects are an inseparable aspect of interconnects due to self-heating caused by the flow of current, and due to environmental heating in high speed designs. This paper presents in detail, thermal effects and their impact on insertion loss, crosstalk and phase of high-speed signals. The paper also describes the thermal sensitivity on various aspects of interconnect design such as inter pair spacing, trace height, and dielectric thickness. For our analysis, simulations were performed using field solvers for temperatures ranging from 20°C to 100°C. Finally, results are analyzed with percentage variation in copper loss versus dielectric losses.
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