浅谈高效测试序列的应用

Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) Pub Date : 2002-04-28 DOI:10.1109/VTS.2002.1011126

R. David, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel

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引用次数: 21

摘要

高缺陷覆盖率需要对不同的故障类型进行良好的覆盖。在本文中，我们提出了一种用于BIST的综合测试向量生成技术，称为随机单输入变化(RSIC)生成，该技术可用于生成数字系统中可能发生的许多任意错误行为的测试，从而提供单片上测试生成解决方案。

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On using efficient test sequences for BIST

High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Input Change (RSIC) generation, that can be used to generate tests for many arbitrary misbehaviors that can occur in digital systems, thus providing a single on-chip test generation solution.

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Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)

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