{"title":"设计容错VLSI阵列处理器的多级仿真工具","authors":"P. Poechmueller, G. Sharma, M. Glesner","doi":"10.1109/ISVD.1991.185139","DOIUrl":null,"url":null,"abstract":"The authors present the design details of an integrated CAD tool for efficient realization of parallel processors for high throughput in real-time digital signal processing (DSP) applications. The array specification language of this tool allows VLSI designer to specify the input at dependence graph, signal flow graph and processor architecture-level. Core of this tool is a functional-structural simulator which is embedded into an environment supporting array processor design. One of the most important features of this CAD tool is that advanced fault-tolerance techniques can be incorporated in an early design phase not only to achieve high reliability and long life time but also to enhance production yields.<<ETX>>","PeriodicalId":183602,"journal":{"name":"[1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design","volume":"126 3","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-01-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Multilevel simulation tool for designing fault-tolerant VLSI array processors\",\"authors\":\"P. Poechmueller, G. Sharma, M. Glesner\",\"doi\":\"10.1109/ISVD.1991.185139\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors present the design details of an integrated CAD tool for efficient realization of parallel processors for high throughput in real-time digital signal processing (DSP) applications. The array specification language of this tool allows VLSI designer to specify the input at dependence graph, signal flow graph and processor architecture-level. Core of this tool is a functional-structural simulator which is embedded into an environment supporting array processor design. One of the most important features of this CAD tool is that advanced fault-tolerance techniques can be incorporated in an early design phase not only to achieve high reliability and long life time but also to enhance production yields.<<ETX>>\",\"PeriodicalId\":183602,\"journal\":{\"name\":\"[1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design\",\"volume\":\"126 3\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-01-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISVD.1991.185139\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISVD.1991.185139","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Multilevel simulation tool for designing fault-tolerant VLSI array processors
The authors present the design details of an integrated CAD tool for efficient realization of parallel processors for high throughput in real-time digital signal processing (DSP) applications. The array specification language of this tool allows VLSI designer to specify the input at dependence graph, signal flow graph and processor architecture-level. Core of this tool is a functional-structural simulator which is embedded into an environment supporting array processor design. One of the most important features of this CAD tool is that advanced fault-tolerance techniques can be incorporated in an early design phase not only to achieve high reliability and long life time but also to enhance production yields.<>