引导转换测试模式,以减少串行扫描的测试时间

Jaynarayan T. Tudu, Satyadev Ahlawat
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引用次数: 0

摘要

扫描测试时间直接影响设计成本,一直是测试研究人员关注的重点问题之一。在这项工作中,我们通过扫描链和测试模式重新排序来解决这个问题。探讨了有限扫描位移的思想。我们提出了扫描链和测试模式重排序的图理论框架。图论问题是为每一个,扫描链和测试模式,重新排序。对于每一个公式化问题,都提出了相应的近似算法。实验结果表明,与atpg工具提供的排序相比,该方法减少了扫描移位时间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Guided shifting of test pattern to minimize test time in serial scan
Scan test time has always been one of the priority issues for test researchers because it directly impact cost of the design. In this work we have addressed the issue through scan chain and test pattern reordering. The idea of limited scan shift is explored. We have proposed a graph theoretical framework for reordering of scan chain and test pattern. Graph theoretic problem is formulated for each, scan chain and test pattern, reordering. For each of the formulated problems corresponding approximation algorithms are proposed. The experimental results show that the proposed methodology reduces the scan shift time compared to the ordering provided by atpg tool.
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