InP晶体生长中位错产生的模拟

S. Gondet, T. Duffar, G. Jacob, N. Van den Bogaert, F. Louchet
{"title":"InP晶体生长中位错产生的模拟","authors":"S. Gondet, T. Duffar, G. Jacob, N. Van den Bogaert, F. Louchet","doi":"10.1109/ICIPRM.1999.773657","DOIUrl":null,"url":null,"abstract":"A Haasen-Sumino model is applied to the generation of the dislocations in InP crystals grown by a modified LEC process. The thermal conditions in the crystal come from a dynamic numerical simulation of the global heat transfer in the furnace. To take into account the behaviour at temperature close to the melting point, a dislocation annihilation model is added and the dislocation density is resolved on each glide system. The computed dislocation densities are in good agreement with the measured values and this method allows a better knowledge on the dislocation multiplication and the optimisation of growth parameters in order to decrease the dislocation density in 3-in iron doped wafer.","PeriodicalId":213868,"journal":{"name":"Conference Proceedings. Eleventh International Conference on Indium Phosphide and Related Materials (IPRM'99) (Cat. No.99CH36362)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Modelling of dislocation generation in InP crystal growth\",\"authors\":\"S. Gondet, T. Duffar, G. Jacob, N. Van den Bogaert, F. Louchet\",\"doi\":\"10.1109/ICIPRM.1999.773657\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A Haasen-Sumino model is applied to the generation of the dislocations in InP crystals grown by a modified LEC process. The thermal conditions in the crystal come from a dynamic numerical simulation of the global heat transfer in the furnace. To take into account the behaviour at temperature close to the melting point, a dislocation annihilation model is added and the dislocation density is resolved on each glide system. The computed dislocation densities are in good agreement with the measured values and this method allows a better knowledge on the dislocation multiplication and the optimisation of growth parameters in order to decrease the dislocation density in 3-in iron doped wafer.\",\"PeriodicalId\":213868,\"journal\":{\"name\":\"Conference Proceedings. Eleventh International Conference on Indium Phosphide and Related Materials (IPRM'99) (Cat. No.99CH36362)\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-05-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Proceedings. Eleventh International Conference on Indium Phosphide and Related Materials (IPRM'99) (Cat. No.99CH36362)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICIPRM.1999.773657\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Proceedings. Eleventh International Conference on Indium Phosphide and Related Materials (IPRM'99) (Cat. No.99CH36362)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIPRM.1999.773657","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

将Haasen-Sumino模型应用于改进LEC法生长的InP晶体中位错的产生。晶体内的热条件来自于对炉内整体传热的动态数值模拟。为了考虑在接近熔点的温度下的行为,加入了位错湮灭模型,并在每个滑动系统上求解了位错密度。计算得到的位错密度与实测值吻合较好,该方法可以更好地了解位错倍增和优化生长参数,以降低3英寸掺杂铁晶圆中的位错密度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Modelling of dislocation generation in InP crystal growth
A Haasen-Sumino model is applied to the generation of the dislocations in InP crystals grown by a modified LEC process. The thermal conditions in the crystal come from a dynamic numerical simulation of the global heat transfer in the furnace. To take into account the behaviour at temperature close to the melting point, a dislocation annihilation model is added and the dislocation density is resolved on each glide system. The computed dislocation densities are in good agreement with the measured values and this method allows a better knowledge on the dislocation multiplication and the optimisation of growth parameters in order to decrease the dislocation density in 3-in iron doped wafer.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信