超大规模集成电路卡滞故障的最优测试集

[1991] Proceedings. First Great Lakes Symposium on VLSI Pub Date : 1991-03-01 DOI:10.1109/GLSV.1991.143950

K. S. Manjunath, S. Whitaker

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引用次数: 1

摘要

最小测试集具有每个输入测试向量同时测试电路中的多个故障的特性。现有的技术使用布尔简化或卡诺图来实现最小化。作者提出了两种新方法，一种是简单的检测设计方法，另一种是图形化设计方法。通过采用一种独特的方法，即首先找到一次测试可以检测到的所有故障，从而简化了最小化过程。

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Optimal test set for stuck-at faults in VLSI

Minimal test sets have the property that each input test vector tests simultaneously several faults in a circuit. Existing techniques use Boolean simplification or Karnaugh maps to achieve minimization. The authors present two new methods, one of which is a simple design by inspection technique and the other is a graphical technique. The process of minimization has been simplified by adopting the unique approach of first finding all the faults that can be detected by a single test.<>

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[1991] Proceedings. First Great Lakes Symposium on VLSI

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