{"title":"无缺陷切割,提高设备可靠性","authors":"C. Johnston, F. Piallat","doi":"10.1109/ESTC.2018.8546448","DOIUrl":null,"url":null,"abstract":"As new technology application devices are relied upon for our safety, security, ease of life and wellbeing, the reliability of such devices is imperative. Devices with unfailing performance are critical to create trustworthy and smarter solutions. The adoption of these devices to “out-of-the-box” applications brings new packaging challenges as devices must withstand and perform in a wide range of physical and environmental conditions. By a virtuous circle, dependence on these solutions will grow as they are increasingly trusted upon for our health, safety, security and to improve our way of life.","PeriodicalId":198238,"journal":{"name":"2018 7th Electronic System-Integration Technology Conference (ESTC)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Defect-Free Dicing for Higher Device Reliability\",\"authors\":\"C. Johnston, F. Piallat\",\"doi\":\"10.1109/ESTC.2018.8546448\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As new technology application devices are relied upon for our safety, security, ease of life and wellbeing, the reliability of such devices is imperative. Devices with unfailing performance are critical to create trustworthy and smarter solutions. The adoption of these devices to “out-of-the-box” applications brings new packaging challenges as devices must withstand and perform in a wide range of physical and environmental conditions. By a virtuous circle, dependence on these solutions will grow as they are increasingly trusted upon for our health, safety, security and to improve our way of life.\",\"PeriodicalId\":198238,\"journal\":{\"name\":\"2018 7th Electronic System-Integration Technology Conference (ESTC)\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 7th Electronic System-Integration Technology Conference (ESTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESTC.2018.8546448\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 7th Electronic System-Integration Technology Conference (ESTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESTC.2018.8546448","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
As new technology application devices are relied upon for our safety, security, ease of life and wellbeing, the reliability of such devices is imperative. Devices with unfailing performance are critical to create trustworthy and smarter solutions. The adoption of these devices to “out-of-the-box” applications brings new packaging challenges as devices must withstand and perform in a wide range of physical and environmental conditions. By a virtuous circle, dependence on these solutions will grow as they are increasingly trusted upon for our health, safety, security and to improve our way of life.