在结温控制系统中结合两个变量以延长igbt功率模块的预期寿命

J. Wölfle, M. Nitzsche, N. Tröster, J. Ruthardt, M. Stempfle, J. Roth-Stielow
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引用次数: 5

摘要

在电力电子应用中,预期寿命是一个重要的问题。本文主要研究igbt功率模块预期寿命的延长问题。交变工况引起的温度波动是主要的影响因素。在低负荷条件下,可以通过增加功率损耗来减小温度波动。这是通过一个基于模型的结温控制系统来实现的。可能的校正变量是开关频率的变化和电流幅度的预设。每个校正变量都有其优点和缺点。本文提出了一种基于模型的结温控制系统,该系统将这两个校正变量有效地结合在一起。该功能在一个三相二电平逆变器上进行了演示,该逆变器配备了打开和黑化的IGBT功率模块,为PMSM供电。校正变量对PMSM的需求输出功率没有负面影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Combination of two variables in a junction temperature control system to elongate the expected lifetime of IGBT-power-modules
In power electronic applications the expected lifetime is an important issue. This paper focuses on the elongation of the expected lifetime of IGBT-power-modules. Temperature swings caused by alternating operation conditions are the major influencing factor. The temperature swings can be reduced by increasing the power losses in low load conditions. This is realized by a model based junction temperature control system. Possible correcting variables are the variation of the switching frequency and the presetting of a current amplitude. Each correcting variable has its benefits and drawbacks. This paper presents a model based junction temperature control system which combines these two correcting variables in a beneficial manner. The functionality is demonstrated on a three phase two level inverter equipped with opened and blackened IGBT power modules feeding a PMSM The correcting variables have no negative influence on the demanded output power of the PMSM.
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