银在Na2SO4环境中的电化学迁移

2015 IEEE 21st International Symposium for Design and Technology in Electronic Packaging (SIITME) Pub Date : 2015-12-03 DOI:10.1109/SIITME.2015.7342357

B. Medgyes, Sándor Ádám, B. Szikora, L. Gál, Patrik Tamási

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引用次数: 0

摘要

采用原位光电检测系统，研究了硫酸盐离子浓度对银电化学迁移(ECM)的影响。发现树突不仅在低硫酸盐离子浓度的电解质溶液中生长，而且在中、高甚至饱和硫酸盐离子浓度的电解质中也能生长。根据平均失效时间(MTTF)值，在低、中浓度水平下，随着硫酸盐离子浓度的增加，迁移敏感性降低。但在饱和浓度水平下，ECM敏感性增加。

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Electrochemical migration of Ag in Na2SO4 environment

The effect of sulphate ion concentration on electrochemical migration (ECM) of silver was investigated by applying an in-situ optical and electrical inspection system. It was found that dendrites grow not only in an electrolyte solution with low sulphate ion concentration but also in electrolytes with medium and high or even saturated sulphate ion concentrations. According to the Mean-Time-To-Failure (MTTF) values, the migration susceptibility was decreased with the increase of sulphate ion concentration in case of low and medium concentration levels. However, the ECM susceptibility was increased at saturated concentration level.

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2015 IEEE 21st International Symposium for Design and Technology in Electronic Packaging (SIITME)

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