测试存储单元的测量系统基于keysight B1500A半导体器件分析仪，运行LabVIEW软件

2017 International Siberian Conference on Control and Communications (SIBCON) Pub Date : 2017-06-01 DOI:10.1109/SIBCON.2017.7998542

I. Shvetsov-Shilovskiy, A. Boruzdina, A. Ulanova, A. A. Orlov, K. Amburkin, A. Nikiforov

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引用次数: 9

摘要

介绍了基于Keysight B1500A半导体器件分析仪的测试存储单元测量系统的研究。被测设备的连接以及所使用设备的完整列表被描述。演示了Keysight VISA远程控制系统的特点;并给出了LabVIEW环境下的代码示例。

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Measurement system for test memory cells based on keysight B1500A semiconductor device analyzer running LabVIEW software

The Keysight B1500A semiconductor device analyzer based measurement system for test memory cells research is introduced. The connection of a device under test is described as well as the full list of the utilized equipment. The features of the Keysight equipment remote control by means of Keysight VISA are demonstrated; code examples in LabVIEW environment are also presented.

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来源期刊

2017 International Siberian Conference on Control and Communications (SIBCON)

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