双模绝缘栅晶体管的径向布局设计概念

L. Storasta, Munaf T. A. Rahimo, M. Bellini, A. Kopta, U. Vemulapati, N. Kaminski
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引用次数: 47

摘要

本文提出了一种新的径向设计概念,用于优化双模绝缘栅晶体管(BiGT)阳极短路的布局。研究表明,n+条纹的排列对BiGT的导通特性起着关键作用。借助三维器件模拟,在0.25 × 4 mm2的大BiGT模型区域内实现了导通过程中等离子体分布的可视化。模拟了阳极短路尺寸和布置的影响,并与实测的导通曲线进行了比较。在三维模拟中观察到,当条纹与导频- igbt边界垂直(径向)排列时,器件中的等离子体分布明显改善。测量结果证实,由于更好地利用了器件面积,导通状态损耗更低。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The radial layout design concept for the Bi-mode insulated gate transistor
In this paper we present a new radial design concept for an optimized layout of anode shorts in the Bi-mode Insulating Gate Transistor (BiGT). The study shows that the arrangement of the n+-stripes plays a key role for the on-state characteristics of the BiGT. With the aid of 3D device simulations the visualization of the plasma distribution during the on-state conduction was obtained in a 0.25 × 4 mm2 large BiGT model area. The influence of the dimensioning and layout of the anode shorts was simulated and compared with measured on-state curves. A clear improvement of plasma distribution in the device when the stripes are arranged orthogonally (radially) to the pilot-IGBT boundary is observed in 3D simulations. Measurements confirm lower on-state losses as a result of better utilization of the device area.
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