{"title":"数字集成元件衬底噪声分布的研究与器件仿真","authors":"T. Krupkina, D. Rodionov","doi":"10.1109/EDM.2009.5173918","DOIUrl":null,"url":null,"abstract":"In this paper aspects of device simulation of digital elements have been reviewed. Theoretical and practical aspects of noise modeling in integrated circuits substrate have been discussed.","PeriodicalId":262499,"journal":{"name":"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Research and device simulation of substrate noise distribution in digital integrated elements\",\"authors\":\"T. Krupkina, D. Rodionov\",\"doi\":\"10.1109/EDM.2009.5173918\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper aspects of device simulation of digital elements have been reviewed. Theoretical and practical aspects of noise modeling in integrated circuits substrate have been discussed.\",\"PeriodicalId\":262499,\"journal\":{\"name\":\"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDM.2009.5173918\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDM.2009.5173918","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Research and device simulation of substrate noise distribution in digital integrated elements
In this paper aspects of device simulation of digital elements have been reviewed. Theoretical and practical aspects of noise modeling in integrated circuits substrate have been discussed.