{"title":"用于ADPLL的103fsrms 1.32mW 50MS/s 1.25MHz带宽两步闪存-ΔΣ时间-数字转换器","authors":"Ying Wu, P. Lu, R. Staszewski","doi":"10.1109/RFIC.2015.7337713","DOIUrl":null,"url":null,"abstract":"A 50-MS/s two-step flash-ΔΣ time-to-digital converter (TDC) using a 2-channel time-interleaved time-domain register with an implicit adder/subtractor demonstrates a 3rd order noise-shaping. The TDC is fabricated in 40-nm CMOS and consumes 1.2 mA from a 1.1 V supply. At frequencies below 1.25 MHz, the TDC error integrates to 103 fsrms, which is equal to an equivalent resolution of 1.6 ps.","PeriodicalId":121490,"journal":{"name":"2015 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"A 103fsrms 1.32mW 50MS/s 1.25MHz bandwidth two-step flash-ΔΣ time-to-digital converter for ADPLL\",\"authors\":\"Ying Wu, P. Lu, R. Staszewski\",\"doi\":\"10.1109/RFIC.2015.7337713\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 50-MS/s two-step flash-ΔΣ time-to-digital converter (TDC) using a 2-channel time-interleaved time-domain register with an implicit adder/subtractor demonstrates a 3rd order noise-shaping. The TDC is fabricated in 40-nm CMOS and consumes 1.2 mA from a 1.1 V supply. At frequencies below 1.25 MHz, the TDC error integrates to 103 fsrms, which is equal to an equivalent resolution of 1.6 ps.\",\"PeriodicalId\":121490,\"journal\":{\"name\":\"2015 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-05-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RFIC.2015.7337713\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFIC.2015.7337713","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 103fsrms 1.32mW 50MS/s 1.25MHz bandwidth two-step flash-ΔΣ time-to-digital converter for ADPLL
A 50-MS/s two-step flash-ΔΣ time-to-digital converter (TDC) using a 2-channel time-interleaved time-domain register with an implicit adder/subtractor demonstrates a 3rd order noise-shaping. The TDC is fabricated in 40-nm CMOS and consumes 1.2 mA from a 1.1 V supply. At frequencies below 1.25 MHz, the TDC error integrates to 103 fsrms, which is equal to an equivalent resolution of 1.6 ps.
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