一种基于故障周期的内存系统基础结构构建的有效解决方案

2013 IEEE 31st VLSI Test Symposium (VTS) Pub Date : 2013-04-29 DOI:10.1109/VTS.2013.6548893

Gurgen Harutunyan, S. Shoukourian, V. Vardanian, Y. Zorian

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引用次数: 9

摘要

本文介绍了一种基于测试算法的故障周期性和规律性规则来构建内存系统基础结构的新方法。提出了用特殊的故障周期表(FPT)和三月测试模板(MTT)的形式来描述所有的周期性和规律性规则。FPT允许在一个表中考虑任何大量的故障，而MTT允许在不使用生成它们的特殊工具的情况下获得3月份的测试。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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An effective solution for building memory BIST infrastructure based on fault periodicity

This paper introduces a new solution for building memory BIST infrastructure, based on rules of fault periodicity and regularity in test algorithms. It is proposed to describe all the periodicity and regularity rules in a form of a special Fault Periodicity Table (FPT) and March Test Template (MTT). FPT allows considering any large number of faults in one table and MTT allows obtaining March tests without using special tools for their generation.

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2013 IEEE 31st VLSI Test Symposium (VTS)

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