{"title":"奇偶网络的最佳测试模式","authors":"D. C. Bossen, D. Ostapko, Arvind M. Patel","doi":"10.1145/1478462.1478472","DOIUrl":null,"url":null,"abstract":"The logic related to the error detecting and/or correcting circuitry of digital computers often contains portions which calculate the parity of a collection of bits. A tree structure composed of Exclusive-OR gates is used to perform this calculation. Similar to any other circuitry, the operation of this parity tree is subject to malfunctions. A procedure for testing malfunctions in a parity tree is presented in this report.","PeriodicalId":438698,"journal":{"name":"AFIPS '70 (Fall)","volume":"230 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1899-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"41","resultStr":"{\"title\":\"Optimum test patterns for parity networks\",\"authors\":\"D. C. Bossen, D. Ostapko, Arvind M. Patel\",\"doi\":\"10.1145/1478462.1478472\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The logic related to the error detecting and/or correcting circuitry of digital computers often contains portions which calculate the parity of a collection of bits. A tree structure composed of Exclusive-OR gates is used to perform this calculation. Similar to any other circuitry, the operation of this parity tree is subject to malfunctions. A procedure for testing malfunctions in a parity tree is presented in this report.\",\"PeriodicalId\":438698,\"journal\":{\"name\":\"AFIPS '70 (Fall)\",\"volume\":\"230 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1899-12-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"41\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"AFIPS '70 (Fall)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1478462.1478472\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"AFIPS '70 (Fall)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1478462.1478472","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The logic related to the error detecting and/or correcting circuitry of digital computers often contains portions which calculate the parity of a collection of bits. A tree structure composed of Exclusive-OR gates is used to perform this calculation. Similar to any other circuitry, the operation of this parity tree is subject to malfunctions. A procedure for testing malfunctions in a parity tree is presented in this report.